This material is published in the open archive of Mid Sweden University DIVA http://miun.diva-portal.org to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders.All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
ABSTRACTWe present a model-based approach to extract the depth and angular resolution in a plenoptic camera. Obtained results for the depth and angular resolution are validated against Zemax ray tracing results. The provided model-based approach gives the location and number of the resolvable depth planes in a plenoptic camera as well as the angular resolution with regards to disparity in pixels. The provided model-based approach is straightforward compared to practical measurements and can reflect on the plenoptic camera parameters such as the microlens f-number in contrast with the principalray-model approach. Easy and accurate quantification of different resolution terms forms the basis for designing the capturing setup and choosing a reasonable system configuration for plenoptic cameras. Results from this work will accelerate customization of the plenoptic cameras for particular applications without the need for expensive measurements.