Abstract:In present work, Variable Angle Spectroscopic Ellipsometer (VASE) is used to determine the optical properties of thermally evaporated thin films Se 15 Te 62.5 Ge 22.5 and Se 10 Te 67.5 Ge 22.5 from 0.8 to 5.1 eV. The experimental data of VASE parameters were fit using two group of models to extract the dielectric function. First group consist from mixtures of several Gaussian, and one Tauc-Lorentz (TL group ). The other group is a mixed from several Gaussian and one Cody-Lorentz dispersion functions (CL group)… Show more
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