“…In fact, since transmission, reflection, and scattering simultaneously contribute to the measured differential spectra, there are ambiguities in assigning the origin of spectral signatures if only one quantity is measured, ruling out the quantitative interpretation of the spectra . Moreover, since free-standing films are not always available or the supporting substrate is often an integral part of the device, it is necessary to develop the analysis of supported thin films, taking into account the influence of the substrate. ,, …”