Optical measurement of liquid film thickness and wave velocity in liquid film flows

Hurlburt, Evan T.; Newell, T.A.

doi:10.1007/bf00189056

Cited by 56 publications

(23 citation statements)

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“…This larger data set has more scatter, but the general trend seen in figure 4 remains with the correlation significantly stronger than if havg I ho were plotted versus Fr. The data sets showing a more rapid transition towards symmetric annular flow (Hurlburt and Newell (1996) and Jayanti et al (1990» are at the lowest LID's. These flows may not be "fully developed" which is argued by Whalley (1987) to require an LID of about 400.…”

Section: Theory (A) Liquid Film Circumferential Symmetrymentioning

confidence: 99%

“…Figure 4 is a plot of data taken at one tube diameter and one LID. Figure 5 shows havg I ho vs. (Iilg / rilL) 0.5 Fr for a range of tube diameters and LID's from a variety of different studies (Dallman 1978;Fukano and Ousaka 1989;Hurlburt and Newell 1996;Jayanti et al 1990;Laurlnat 1982;Paras and Karabelas 1991;Williams 1990). This larger data set has more scatter, but the general trend seen in figure 4 remains with the correlation significantly stronger than if havg I ho were plotted versus Fr.…”

Section: Theory (A) Liquid Film Circumferential Symmetrymentioning

confidence: 99%

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Prediction of the Circumferential Film Thickness Distribution in Horizontal Annular Gas-Liquid Flow

Hurlburt

Newell

2000

Journal of Fluids Engineering

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Section: Theory (A) Liquid Film Circumferential Symmetrymentioning

confidence: 99%

Section: Theory (A) Liquid Film Circumferential Symmetrymentioning

confidence: 99%

Prediction of the Circumferential Film Thickness Distribution in Horizontal Annular Gas-Liquid Flow

Hurlburt

Newell

2000

Journal of Fluids Engineering

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“…A novel optical technique has been presented that also uses the total internal reflection of light rays to measure the height of liquid films (Hurlburt and Newell;. This method offers many advantages over other measurement techniques: It is non-intrusive; no permanent mounting is required so data can be acquired at any point of a clear test section; any liquid can be measured; no calibration is required since the method is a direct measurement of a signal that is a linear function of the film height; and it is relatively inexpensive and easy to construct.…”

Section: Total Internal Reflection Of Lightmentioning

confidence: 99%

Automated optical liquid film thickness measurement method

Shedd¹,

Newell²

1998

Review of Scientific Instruments

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100

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The need to measure the thickness of thin liquid films is evident from the number of methods that have been developed to do so. Many of these methods have significant drawbacks, such as intrusive probes or the dependence on a conductive liquid. A non-intrusive, automated, optical film thickness measurement technique has been developed to be used with a wide range of fluids and with virtually any flow configuration. In this method, light is reflected from the surface of a liquid film flowing over a transparent wall. This reflected light generates an image on the outside of the wall which is captured and digitized using a CCD camera and framegrabber card in a desktop computer. The image is processed to determine the positions of the reflected light rays, with which the film thickness and film slope are calculated. The entire process is automated and can be performed in less than 9 seconds on a 486 PC, allowing many data points to be collected efficiently. Film thicknesses as small as 0.03 mm can be determined using inexpensive components, with the possibility of greater precision using more advanced imaging equipment. An automated calibration procedure allows for the determination of the necessary physical parameters automatically, so the index of refraction of the test fluid or the test section wall need not be known a-priori. A prototype of the automated system generates static liquid measurements that agree to within 3% of measurements made using the needle-contact method. Film thickness data are also presented for an air-water system in cylindrical, annular, two-phase flow and compared with data from the literature.111

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“…It was concluded that the boiling process were dominated by two characteristic periods, i.e., microlayer dominant and liquid saturated periods. Hurlburt & Newell (1996) developed a device which can measure liquid film thickness from total light reflection. Using the same method, Shedd & Newell (2004) measured liquid film thickness of air/water two-phase flow in round, square and triangular tubes.…”

Section: Introductionmentioning

confidence: 99%

Liquid Film Thickness in Micro-Scale Two-Phase Flow

Shikazono¹,

Han²

2011

Two Phase Flow, Phase Change and Numerical Modeling

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Optical measurement of liquid film thickness and wave velocity in liquid film flows

Abstract: helped build the laboratory facilities. The ACRC receives continuing support from the Richard W. Kritzer Endowment and the National Science Foundation. The following organizations have also become sponsors of the Center.

Cited by 56 publications

References 5 publications

Prediction of the Circumferential Film Thickness Distribution in Horizontal Annular Gas-Liquid Flow

Prediction of the Circumferential Film Thickness Distribution in Horizontal Annular Gas-Liquid Flow

Automated optical liquid film thickness measurement method

Liquid Film Thickness in Micro-Scale Two-Phase Flow

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