2013
DOI: 10.3938/jkps.62.1301
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Optical investigation of GaInP-AlGaInP quantum-well layers for high-power red laser diodes

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Cited by 4 publications
(5 citation statements)
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“…At the edge and the corner, E2 is much lower than the confinement energy, 76 meV and 67 meV, similar to the work done by Kim et al [17]. In this case, the major loss mechanism is attributed to recombination centers in the Al-containing layer (barriers or interface) associated with Al-O complexes [17], [18]. By analogy, we can conclude that a thermal emission of carriers out of the wells is excluded at the edges and it is very likely that sidewall defects are responsible for non-radiative recombinations instead of native defects at the well/barrier interface.…”
Section: Resultssupporting
confidence: 88%
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“…At the edge and the corner, E2 is much lower than the confinement energy, 76 meV and 67 meV, similar to the work done by Kim et al [17]. In this case, the major loss mechanism is attributed to recombination centers in the Al-containing layer (barriers or interface) associated with Al-O complexes [17], [18]. By analogy, we can conclude that a thermal emission of carriers out of the wells is excluded at the edges and it is very likely that sidewall defects are responsible for non-radiative recombinations instead of native defects at the well/barrier interface.…”
Section: Resultssupporting
confidence: 88%
“…with 309 meV is in the same order of magnitude than the confinement energy in our quantum wells structure, suggesting that the major losses at the center are dominated by thermal emission [19]. At the edge and the corner, E2 is much lower than the confinement energy, 76 meV and 67 meV, similar to the work done by Kim et al [17]. In this case, the major loss mechanism is attributed to recombination centers in the Al-containing layer (barriers or interface) associated with Al-O complexes [17], [18].…”
Section: Resultssupporting
confidence: 87%
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