2013
DOI: 10.1016/j.phpro.2013.03.165
|View full text |Cite
|
Sign up to set email alerts
|

Optical In-Process Temperature Monitoring of Selective Laser Melting

Abstract: Investigation of the melting of overhang layers has been conducted under full temperature monitoring. Mechanisms of the melt penetration into loose powder bed have been determined. Temperature regimes of the selective laser melting process of the 3D object from steel 316L powder also have been investigated.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
19
0
1

Year Published

2014
2014
2024
2024

Publication Types

Select...
5
2
2
1

Relationship

0
10

Authors

Journals

citations
Cited by 44 publications
(22 citation statements)
references
References 9 publications
0
19
0
1
Order By: Relevance
“…Optical methods are the easiest to use during experimentation, as they are usually non-disruptive to the process and can be applied externally without modifying the process or equipment. A number of excellent optimal monitoring systems has been developed, in particular those by Craeghs et al [98][99][100][101], Kleszczynski et al [119], Clijsters et al [120], Chivel [121], Grasso et al [122], Hirsh et al [123], Kanko et al [124] and Lott et al [125]. Infrared thermography systems for SLM/DMSL have been developed by Rodriguez et al [126] and Smurov et al [127].…”
Section: Optical Process Monitoringmentioning
confidence: 99%
“…Optical methods are the easiest to use during experimentation, as they are usually non-disruptive to the process and can be applied externally without modifying the process or equipment. A number of excellent optimal monitoring systems has been developed, in particular those by Craeghs et al [98][99][100][101], Kleszczynski et al [119], Clijsters et al [120], Chivel [121], Grasso et al [122], Hirsh et al [123], Kanko et al [124] and Lott et al [125]. Infrared thermography systems for SLM/DMSL have been developed by Rodriguez et al [126] and Smurov et al [127].…”
Section: Optical Process Monitoringmentioning
confidence: 99%
“…A number of excellent optimal monitoring systems have been developed, in particular those by Craeghs et al [97][98][99][100], Kleszczynski et al [116], Clijsters et al [117], Chivel [118], Grasso et al [119], Hirsh et al [120], Kanko et al [121], and Lott et al [122]. Infrared thermography systems for SLM/DMSL have been developed by Rodriguez et al [123] and Smurov et al [124].…”
Section: Optical Process Monitoringmentioning
confidence: 99%
“…Craeghs et al [97][98][99][100], Kleszczynski et al [116], Clijsters et al [117], Chivel [118], Grasso et al [119], Hirsh et al [120], Kanko et al [121], and Lott et al [122]. Infrared thermography systems for SLM/DMSL have been developed by Rodriguez et al [123] and Smurov et al [124].…”
Section: Optical Process Monitoringmentioning
confidence: 99%