Optical holography in the hard X-ray domain

X-ray dynamical diffraction Fraunhofer holography

“…The corresponding analogues in the hard X-ray region nowadays are presented [in all the hard X-ray holographic methods the reconstruction can be performed using visible light or numerical (mathematical) methods of reconstruction]: X-ray interferometric holography (Egiazaryan & Bezirganyan, 1980;Egiazaryan, 1998;Egiazaryan et al, 1998, and references therein), X-ray in-line holography (Snigirev et al, 1995;Nugent et al, 1996;Paganin, 2006, and references therein), X-ray Gabor and Fourier holography (Leitenberger & Snigirev, 2001;Watanabe et al, 2003;Iwamoto & Yagi, 2011, and references therein). According to the method of X-ray interferometric holography, a three (Egiazaryan & Bezirganyan, 1980;Egiazaryan, 1998) or four block (Egiazaryan et al, 1998) X-ray Laue case interferometer must be used.…”

“…By illuminating this photographic plate by a wave of visible light, one reconstructs the X-ray point-source visible image. In the works of Leitenberger & Snigirev (2001) and Watanabe et al (2003), the necessary X-ray point reference source is obtained as a result of focusing by an X-ray zone plate. X-ray Fourier and Gabor holograms are recorded in a vacuum.…”

Gabor Holography with Speckle-Free Spherical Wave in Hard X-ray Region

“…Since the beginning of X-ray holography, Gabor-type holography has been widely used in the hard X-ray region. Although the characteristic X-ray beam from a fine-focus X-ray tube is firstly used as a coherent X-ray wave for X-ray Gabor holography, 2) high brilliant synchrotron radiation X-ray sources are now used for holographic imaging, [3][4][5][6][7][8][9][10][11] including Fourier transform holography. [12][13][14][15][16][17] Recently, a free electron laser source has been applied to Gabor-type holography in the VUV and soft X-ray regions.…”

Software image alignment for X‐ray microtomography with submicrometre resolution using a SEM‐based X‐ray microscope

“…This form of contrast is dependent on refraction rather than absorption of X-rays and so enables the imaging of weakly or non-absorbing samples. This has been demonstrated at synchrotrons either using optics or a pinhole to form a secondary source (Jacobsen et al, 1990;Watanabe et al, 2002) or else using simpler parallel beam methods requiring no optics (Snigirev et al, 1995;Baruchel et al, 2000). A microfocus laboratory-based system lends itself to this approach (Wilkins et al, 1996;Yoshimura et al, 2000).…”