The effects of electrochemical treatment in either 21%(NH 4 ) 2 S-H 2 O or 16%Na 2 S-C 3 H 7 OH solutions on the surface properties of GaSb, In 0.23 Ga 77 As 0.18 Sb 0.82 and Al 0.34 Ga 0.66 As 0.025 Sb 0.975 have been investigated by complementary use of Variable Angle Spectroscopic Ellipsometry (VASE) and X-ray Photoelectron Spectroscopy (XPS). We have shown that electrochemical sulphuration enables to produce 94-350 nm thick insulating overcoats with good surface morphology. The main components of the passivating layers are Ga 2 S 3 and Sb 2 S 5 when formed on GaSb, while additional components of In 2 S 3 , admixture of Al 2 O 3 and appearance of Al-As bond were observed on InGaAsSb and AlGaAsSb , respectively. The main feature distinguishing the effect of electrochemical treatment in Na 2 S-C 3 H 7 OH when comparing to those in (NH 4 ) 2 S-H 2 O is that passivating layers contain additional components of Na 2 SO 3 and/or Na 2 SO 4 .