2007
DOI: 10.1364/oe.15.004445
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Optical constant determination of an anisotropic thin film via polarization conversion

Abstract: This study presents a simple method for determining the optical constants of an anisotropic thin film. The sensitivity of enhanced polarization conversion reflectance to optical constants is also calculated and analyzed. Based on the sensitivity calculation, the principal indices and columnar tilt angle can be derived from the polarization conversion reflectance angular spectrum.

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Cited by 29 publications
(13 citation statements)
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“…The phase retardation remained the same from 2 to 72 h after fabrication. Using a sensitive polarization conversion method 30 , we found that all three principal refractive indexes of a Ta 2 O 5 thin film did not vary from 1 to 144 h after fabrication. Figure 4, when the incident light is linearly polarized at 45° to the x axis in the xy plane.…”
Section: Methodsmentioning
confidence: 94%
“…The phase retardation remained the same from 2 to 72 h after fabrication. Using a sensitive polarization conversion method 30 , we found that all three principal refractive indexes of a Ta 2 O 5 thin film did not vary from 1 to 144 h after fabrication. Figure 4, when the incident light is linearly polarized at 45° to the x axis in the xy plane.…”
Section: Methodsmentioning
confidence: 94%
“…The deposition rate was maintained at 0.6 nm/s read by quartz thickness monitor next to the substrate during deposition. The optical constants of the anisotropic thin film were found to be 1 (n , 2 n , 3 , ) n β = (1.304, 1.303, 1.323, 41.5 )° by measuring the angular spectrum of polarization conversion reflectance [8]. The thickness of the film was 1100 nm.…”
Section: Experimental Modulation By An Anisotropic Mgf 2 Thin Filmmentioning
confidence: 99%
“…The birefringence of typical dielectric anisotropic thin films (MgF 2 , TiO 2 and SiO 2 ) is small-less than 0.03. However, enhanced polarization conversion (PC) reflectance (the reflected p-polarization light intensity divided by the incident s-polarization light intensity) can be detected by such a low dielectric anisotropic thin film in a prism coupling system (prism/film/air) and by allowing the deposition plane defined by the rods and the surface normal not to be coincident with the plane of incidence [6]. The PC reflectance Rsp increases as the orientation of film increases from 0 • to 90 • .…”
Section: Introductionmentioning
confidence: 99%