Optical characterization of three‐dimensional surface and bulk anisotropy in high refractive index polymers

Abstract

Interest in the development of polymeric materials for high temperature, electronic and microelectronic applications has led to an increasing number of new polymers. Many of these polymers have complex organic ring structures and semirigid backbones, characteristics that have posed some difficulties for structural analysis. The purpose of this paper is to test and compare two practical nondestructive optical techniques, polarized optical microscopy and polarized refractometry, for the determination of three‐dimensional surface and bulk anisotropy in these advanced materials. The optical techniques are first tested on a series of optically homogeneous uniaxially oriented isotactic polypropylene films and then applied to the analysis of high refractive index Kapton (PMDA‐ODA) polyimide films. The study includes a test of the validity of the compensator method, including the effect of fringe jumping, the use of polymer retarders, and the tilting technique of Stein.

Water‐sorption behaviors of poly(3,4′‐oxydiphenylene pyromellitimide) films depending on the thickness variation

“…17,22,34,35 The refractive indices and birefringence in PMDA-3,4ЈODA films, which is a measure of molecular in-plane orientation, 22,24,36,37 were obtained as a function of film thickness using a prism coupler (see Table I). The in-plane refractive index (n xy ) was always higher than the out-of-plane refractive index (n z ), regardless of the film thickness.…”

Selection Criteria for Multichip Module Dielectrics

“…In the presence of a substrate such materials orient themselves with respect to the substrate and consequently many properties are anisotropic [5]. Particularly in rigid rod-like polyimides, the dielectric constant in the plane may be higher than that perpendicular to the plane [5], [7], [24]- [26]. Unfortunately measured by the usual parallel plate capacitance method only the lower value, that perpendicular to the plane, can be determined.…”