Optical characterization of polyethylene and cobalt phthalocyanine ultrathin films by means of the ATR technique at surface plasmon resonance

Abstract

It is well known that the development and determination of optical properties of ultrathin films is an important issue in many technological areas. In this work organic polyethylene (PE) and cobalt phthalocyanines (CoPc) ultrathin films were deposited over metal films using the r.f. sputtering and thermal evaporation techniques, respectively. Attenuated total reflection (ATR) measurements for the system organic film/metal at the surface plasmon resonance (SPR) were used for determining the thicknesses and optical properties of the PE and CoPc thin films. Thicknesses of the order of some nanometers were found, fitting the theoretical multilayer ATR model, for p polarization monochromatic light, to the experimental reflection data. The dielectric function of CoPc ultrathin films was determined at a wavelength of 632.8 nm. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Development of a Surface Plasmon Resonance n-dodecane Vapor Sensor

“…From the theoretical fitting of the SPR reflectivity to the experimental data, as done in Ref. [17], it was found that the dielectric function of the gold film for a 632.8 nm wavelength of the incident light was ε Au = −12.32 + 1.5i and the thickness of the thin polyethylene film was 7.1 nm [17]. …”

“…[17], gold films of 52.4 nm thicknesses were coated on 7059 glass corning substrates by the thermal evaporation method. The commercial monitor MASTEK Inc. , which uses a crystal resonator as a sensor, was used to measure the thickness of the gold films.…”

“…The completed structural and optical characterizations of the polyethylene thin films on gold were reported in Ref. [17]. In this work, the same developed polyethylene thin films were applied as vapor sensing layers [17].…”

“…[17]. In this work, the same developed polyethylene thin films were applied as vapor sensing layers [17]. …”

Study of Co-phthalocyanine films by surface plasmon resonance spectroscopy

“…14,15 Their optical properties have been studied extensively by different techniques. [16][17][18][19][20][21] However, as shown in Table I, there is a large disagreement in the reported values of e when measured at 632.8 nm. The determination of the thickness of very thin CoPc films (d < 50 nm) is also difficult because the low reflectivity of these materials makes difficult to obtain well defined X-ray interference patterns.…”