[Proceedings] 1990 IEEE 7th International Symposium on Applications of Ferroelectrics
DOI: 10.1109/isaf.1990.200359
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Optical characterization of lithium niobate thin films

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Cited by 3 publications
(1 citation statement)
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“…The film thickness and refractive index of the Si nanoparticleembedded planar waveguide were measured by the prism coupler method (Metricon model 2010) [26,27]. The sample was in contact with the base of a high index prism (Metricon 200-P-4, n p = 2.165) and pressed with a coupling head on a rotary table by a high nitrogen pressure to control the incident angle θ , as illustrated in figure 2.…”
Section: Measurement and Calculation Of The Optical Transmission Mode...mentioning
confidence: 99%
“…The film thickness and refractive index of the Si nanoparticleembedded planar waveguide were measured by the prism coupler method (Metricon model 2010) [26,27]. The sample was in contact with the base of a high index prism (Metricon 200-P-4, n p = 2.165) and pressed with a coupling head on a rotary table by a high nitrogen pressure to control the incident angle θ , as illustrated in figure 2.…”
Section: Measurement and Calculation Of The Optical Transmission Mode...mentioning
confidence: 99%