Optical characterization of grain orientation in crystalline materials

Gaskey, Bernard; Hendl, Ludwig; Wang, Xiaogang; Seita, Matteo

doi:10.1016/j.actamat.2020.05.027

Cited by 27 publications

(18 citation statements)

References 24 publications

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“…Here, as defined by Ram et al, the accuracy describes the distance between the measured value and the true value (the ground truth), and the precision is the standard deviation of several repeated measurements of the same physical object. The true crystal orientation is generally unknown, and as EBSD is the most commonly adopted technique to obtain crystal orientation, its measurement is often used as a reliable ground truth to characterize the accuracy of other measurement techniques [32]. One way to circumvent the absence of ground truth in accuracy assessment is to exploit the known sample features, such as twins in metallic samples.…”

Section: Precision and Accuracy Of Ebsd Indexationmentioning

confidence: 99%

Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

Shi

Jiao

Loisnard

et al. 2022

Materials Characterization

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Section: Precision and Accuracy Of Ebsd Indexationmentioning

confidence: 99%

Improved EBSD indexation accuracy by considering energy distribution of diffraction patterns

Shi

Jiao

Loisnard

et al. 2022

Materials Characterization

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“…Based on this principle, techniques have been developed to quantify orientation-dependent changes in light intensity and polarization upon reflection from optically active materials 8,9 , or to reconstruct the topography of etch-pits 10 , which inherit their geometry and orientation from the underlying atomic lattice. Directional reflectance microscopy (DRM) falls in this second category 10,11 . The working principle of DRM is based on measuring and analyzing the reflection of light from the surface of the material as a function of the illumination direction [10][11][12] .…”

Section: Introductionmentioning

confidence: 99%

A machine learning approach to map crystal orientation by optical microscopy

Wittwer

Seita

2022

npj Comput Mater

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Mapping grain orientation in crystalline solids is essential to investigate the relationships between local microstructure and crystallography and interpret materials properties. One of the main techniques used to perform these studies is electron backscatter diffraction (EBSD). Due to the limited measurement throughput, however, EBSD is not suitable for characterizing samples with long-range microstructure heterogeneity, nor for building large material libraries that include numerous specimens. We present a machine learning approach for high-throughput crystal orientation mapping, which relies on the optical technique called directional reflectance microscopy. We successfully apply our method on Inconel 718 specimens produced by additive manufacturing, which exhibit complex, spatially-varying microstructures. These results demonstrate that optical orientation mapping on a metal alloy is achievable. Since our method is data-driven, it can be easily extended to different alloy systems produced using different manufacturing processes.

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“…Crystallographic orientation information is of vital importance in many domains of application such as materials science, geology or semi-conductor industry. Different methods have been proposed to obtain crystal orientation, such as optical reflection method [1] and chemical corrosion method [2]. In recent decades, Electron BackScatter Diffraction (EBSD) technique has revealed to be a technique of choice to obtain crystallographic orientation fields in scanning electron microscopes.…”

Section: Introductionmentioning

confidence: 99%