Sixth International Conference Metalorganic Vapor Phase Epitaxy
DOI: 10.1109/movpe.1992.665021
|View full text |Cite
|
Sign up to set email alerts
|

Optical Characterization of GalnP Layers

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 1 publication
0
2
0
Order By: Relevance
“…16,30,31 Semiconductor parameters used in the model were taken from previous studies. [32][33][34][35][36][37][38][39][40][41] For the analysis of the electronic characteristics of the solar cells, J-V dark and 1 sun J(V)-Jsc were fitted using a two-diode model, with fixed diode idealities of 1 and 2. 28,42 3 | RESULTS AND DISCUSSION…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…16,30,31 Semiconductor parameters used in the model were taken from previous studies. [32][33][34][35][36][37][38][39][40][41] For the analysis of the electronic characteristics of the solar cells, J-V dark and 1 sun J(V)-Jsc were fitted using a two-diode model, with fixed diode idealities of 1 and 2. 28,42 3 | RESULTS AND DISCUSSION…”
Section: Methodsmentioning
confidence: 99%
“…They are directly related to the drift‐diffusion model in the emitter, the base, and the depletion region . Semiconductor parameters used in the model were taken from previous studies …”
Section: Methodsmentioning
confidence: 99%