2014
DOI: 10.1016/j.tsf.2014.09.027
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Optical characterization of epitaxial single crystal CdTe thin films on Al2O3 (0001) substrates

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Cited by 7 publications
(5 citation statements)
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“…It has been previously demonstrated that single crystal thin films of CdTe can be grown on the basal plane of sapphire substrates, which have similar or higher quality than their bulk substrate counterparts. [ 10,11 ] The most stable surface reconstruction of α‐Al 2 O 3 (0001) is a single Al‐termination (Figure S1, Supporting Information), which is nonpolar. [ 12,13 ] This surface has sixfold rotational symmetry and thus geometrically, there are two‐possible in‐plane domain rotations for a threefold CdTe system to align as seen in Figure a.…”
Section: Figurementioning
confidence: 99%
“…It has been previously demonstrated that single crystal thin films of CdTe can be grown on the basal plane of sapphire substrates, which have similar or higher quality than their bulk substrate counterparts. [ 10,11 ] The most stable surface reconstruction of α‐Al 2 O 3 (0001) is a single Al‐termination (Figure S1, Supporting Information), which is nonpolar. [ 12,13 ] This surface has sixfold rotational symmetry and thus geometrically, there are two‐possible in‐plane domain rotations for a threefold CdTe system to align as seen in Figure a.…”
Section: Figurementioning
confidence: 99%
“…Specific candidates of opaque NTE films include metallic perovskite ReO 3 (Chatterji et al, 2009a;Chatterji et al, 2009b;Rodriguez et al, 2009), semiconducting Sm 0.8 Y 0.2 S (Takenaka et al, 2019;Mazzone et al, 2020), and insulating Si (Shah and Straumanis, 1972) or CdTe (Greenough and Palmer, 1973;Jovanovic et al, 2014) at low temperature at pump photon energies exceeding their band gap (1 and 1.51 eV at 300 K respectively (Bludau et al, 1974;Jovanovic et al, 2014)). Given recent advances in high-harmonic generation of laser sources, any NTE material could be considered if the photon energy exceeds the candidate material band gap.…”
Section: Results: Strain Waves Produced In Materials With Negative Thermal Expansionmentioning
confidence: 99%
“…The mechanism of the passivation is not yet clear but could be due to a high density of fixed negative charge or the low degree of lattice mismatch (3.7%) between the unit cell of the (0001) surface of Al 2 O 3 and the (111) surface of CdTe . These characteristics offer the potential for repelling minority carriers and creating a low defect density interface, respectively. ,,, …”
Section: Introductionmentioning
confidence: 95%
“…19 These characteristics offer the potential for repelling minority carriers and creating a low defect density interface, respectively. 16,18,20,21 While demonstration of long carrier lifetimes via an optical measurement is promising, to date there is no clear evidence for back-surface passivation in an operating CdTe device. Previous attempts have included deposition of alumina by atomic layer deposition (ALD) 22 and sputtering.…”
Section: ■ Introductionmentioning
confidence: 99%