Optical characterization of different module technologies

Abstract

For a complete quality control of different module technologies (crystalline and thin film) a combination of fast and non-destructive methods was investigated. Camera-based measurements, such as electroluminescence (EL), photoluminescence (PL), and infrared (IR) technologies, offer excellent possibilities for determining production failures or defects in solar modules, which cannot be detected by means of standard power measurements. These types of optical measurement provide high resolution images with a two-dimensional distribution of the characteristic features of PV modules. This paper focuses on quality control and characterization using EL, PL, and IR imaging with conventional cameras and an alternative excitation source for the PL-setup.