1999
DOI: 10.1016/s0022-0248(98)01094-x
|View full text |Cite
|
Sign up to set email alerts
|

Optical and structural properties of epitaxial GaN films grown by pulsed laser deposition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
13
0

Year Published

2001
2001
2016
2016

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 22 publications
(13 citation statements)
references
References 14 publications
0
13
0
Order By: Relevance
“…Instead, it is attributed to the less commonly observed Y 2 line, 49 normally detected at 3.40 eV, but, again, the emission can be shifted toward lower energy due to tensile stress. The Y 2 line is reported to be influenced by acceptor doping 49 (like carbon) and is strongly related to stacking faults parallel to the substrate/film interface, 50,51 which originate from the overgrowth in the lateral direction of GaN islands with different altitudes, as described above in Sec. III C. The broad peak in the lower energy section of Fig.…”
Section: Influence On Optical Propertiesmentioning
confidence: 87%
“…Instead, it is attributed to the less commonly observed Y 2 line, 49 normally detected at 3.40 eV, but, again, the emission can be shifted toward lower energy due to tensile stress. The Y 2 line is reported to be influenced by acceptor doping 49 (like carbon) and is strongly related to stacking faults parallel to the substrate/film interface, 50,51 which originate from the overgrowth in the lateral direction of GaN islands with different altitudes, as described above in Sec. III C. The broad peak in the lower energy section of Fig.…”
Section: Influence On Optical Propertiesmentioning
confidence: 87%
“…2͑a͒, indicating that it is not due to an oxygen impurity as previously suggested. 6 The 3.368 and 3.310 eV transitions, labeled I 3 and I 4 , respectively, 15 are strongly enhanced for the GaN samples grown on GaAs͑100͒ ͓Fig.…”
mentioning
confidence: 98%
“…[2][3][4] Pulsed-laser deposition ͑PLD͒ was also used successfully to grow GaN. [5][6][7][8][9][10] Previous research on GaN has focused on epitaxial growth of hexagonal GaN on sapphire͑0001͒, [5][6]8,10 fused silica, or Si substrates, 9 and cubic GaN on GaAs͑001͒ substrates. 2,11,12 However, PLD was never used to grow GaN on a GaAs͑001͒ substrate.…”
mentioning
confidence: 99%
“…The surface of this sample is rougher than other PLD films due to the high growth rate (~0.8 nm/sec) and the high nitrogen pressure used for deposition (400 mTorr). It has been observed that the increase of the background gas pressure causes a decrease in the velocity of the species in the plasma plume [12]; hence, the films grown at high pressure conditions are likely to exhibit more defects than those deposited at lower pressures [13]. Additionally, the film was grown directly on sapphire (no buffer layer) so that consequently the film is strained.…”
Section: Resultsmentioning
confidence: 99%