Abstract:We demonstrate the use of the D1/D2 defect luminescence spectral range (1400 nm < λ < 1700 nm) of dislocations in cast-mono silicon to access geometrical tilt and opto-electronic recombination properties in their vicinity. The angle between dislocation and surface was determined thanks to the spatial asymmetry of the PL intensity in the regions close to the dislocations. Our optical model relies on the classical recombination-diffusion continuity equation as well as simple optical absorption and light propagat… Show more
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