Optical and electrical properties of Cu6PS5I-based thin films versus copper content variation

Abstract

Abstract. Cu 6 PS 5 I-based thin films are deposited onto silicate-glass substrates using magnetron sputtering. Their chemical compositions are determined with the aid of energy-dispersive X-ray spectroscopy. Changes in the Raman spectra of the Cu 6 PS 5 I-based thin films with respect to the spectra typical for crystalline Cu 6 PS 5 I are discussed. Optical absorption spectra and refractive indices for the films with different Cu contents are studied. Decrease in the energy pseudogap and the Urbach energy is observed with increasing Cu content, accompanied by increase in the refractive index. Electrical conductivity of the Cu 6 PS 5 I-based thin films is revealed to increase nonlinearly with increasing copper concentration.

Mechanical properties of Cu6PS5І superionic crystals and thin films

“…At the same time, the conductivity of these films increased [24,25]. It is well known that high ionic conductivity of the investigated thin films is caused by formation of conductive channels from dendrites and crystal clusters by spinodal decomposition when the copper content increases [26]. In this case, the film would consist of rigid nanocrystallites and their clusters distributed in more ductile amorphous matrix [26].…”

“…It is well known that high ionic conductivity of the investigated thin films is caused by formation of conductive channels from dendrites and crystal clusters by spinodal decomposition when the copper content increases [26]. In this case, the film would consist of rigid nanocrystallites and their clusters distributed in more ductile amorphous matrix [26]. Hardness may increase due to this nanocomposite structure if the content of soft matrix phase is sufficiently small.…”