2015
DOI: 10.1016/j.mssp.2015.06.030
|View full text |Cite
|
Sign up to set email alerts
|

Optical and electrical measurement of FeSe2 thin films obtained at low temperature

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
0
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 8 publications
(3 citation statements)
references
References 30 publications
(28 reference statements)
0
0
0
Order By: Relevance
“…[ 5 ] Other methods prepared FeSe 2 thin films through selenization of iron films at 350 °C and 6 h annealing time. [ 6 ] These films were of crystalline nature but exhibited low transmittance and low reflectance in the spectral range of 400–1800 nm. [ 6 ] The energy bandgap of these films was as low as 1.1 eV.…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…[ 5 ] Other methods prepared FeSe 2 thin films through selenization of iron films at 350 °C and 6 h annealing time. [ 6 ] These films were of crystalline nature but exhibited low transmittance and low reflectance in the spectral range of 400–1800 nm. [ 6 ] The energy bandgap of these films was as low as 1.1 eV.…”
Section: Introductionmentioning
confidence: 99%
“…[ 6 ] These films were of crystalline nature but exhibited low transmittance and low reflectance in the spectral range of 400–1800 nm. [ 6 ] The energy bandgap of these films was as low as 1.1 eV. [ 6 ] In a study that targeted deposition of iron selenide FeSe 2 thin films by the pulsed laser deposition technique onto CaF 2 , LiF, and SrTiO 3 substrates, crystalline iron monoselenide phase was formed.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation