Operation of X-ray gas monitors at the European XFEL

Maltezopoulos, Theophilos; Dietrich, Florian; Freund, Wolfgang; Jastrow, U.; Koch, Andreas; Laksman, Joakim; Liu, Jia; Planas, Marc; Сорокин, А. А.; Tiedtke, K.; Grünert, Jan

doi:10.1107/s1600577519003795

Cited by 49 publications

(42 citation statements)

References 21 publications

(23 reference statements)

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“…Background characterization. The background scattering data were collected in the third shift, comprising 4000 images taken with an average pulse energy of 1.135 mJ, as measured by the Xray gas monitor detector 23 , and 120,000 images with an average pulse energy of 1.477 mJ in the fourth shift.…”

Section: Resultsmentioning

confidence: 99%

Megahertz single-particle imaging at the European XFEL

et al. 2020

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The emergence of high repetition-rate X-ray free-electron lasers (XFELs) powered by superconducting accelerator technology enables the measurement of significantly more experimental data per day than was previously possible. The European XFEL is expected to provide 27,000 pulses per second, over two orders of magnitude more than any other XFEL. The increased pulse rate is a key enabling factor for single-particle X-ray diffractive imaging, which relies on averaging the weak diffraction signal from single biological particles. Taking full advantage of this new capability requires that all experimental steps, from sample preparation and delivery to the acquisition of diffraction patterns, are compatible with the increased pulse repetition rate. Here, we show that single-particle imaging can be performed using X-ray pulses at megahertz repetition rates. The results obtained pave the way towards exploiting high repetition-rate X-ray free-electron lasers for single-particle imaging at their full repetition rate.

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Section: Resultsmentioning

confidence: 99%

Megahertz single-particle imaging at the European XFEL

et al. 2020

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“…The specifications of the imager are given in Table 1. More details on position calibration of the XGM are given by Maltezopoulos et al (2019) and by Sorokin et al (2019). The position information of the XGM depends on the measurement of ion currents and is linear only over a restricted range of beam positions (Tiedtke et al, 2008).…”

Section: Applications For Diagnostic Imagers 21 Position Correlationmentioning

confidence: 99%

Operation of photon diagnostic imagers for beam commissioning at the European XFEL

Koch

Risch

Freund

et al. 2019

J Synchrotron Radiat

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X‐ray photon beam diagnostic imagers are located at 24 positions in the European XFEL beam transport system to characterize the X‐ray beam properties, and to give feedback for tuning and optimization of the electron acceleration and orbit, the undulators, and the X‐ray optics. One year of commissioning allowed experience to be gained with these imagers, which will be reported here. The sensitive Spontaneous Radiation imager is useful for various investigations in spontaneous radiation mode: for undulator adjustments and for low‐signal imaging applications. The high‐resolution Free‐Electron Laser imager, 10 µm spatial resolution, is extensively used for the monitoring of beam position, spot size and shape, gain curve measurements, and also for beam‐intensity monitoring. The wide field‐of‐view pop‐in monitors (up to 200 mm) are regularly used for alignment and tuning of the various X‐ray optical components like mirrors, slits and monochromators, and also for on‐line beam control of a stable beam position at the instruments. The Exit Slit imager after the soft X‐ray monochromator provides spectral information of the beam together with multi‐channel plate based single‐pulse gating. For particular use cases, these special features of the imagers are described. Some radiation‐induced degradation of scintillators took place in this initial commissioning phase, providing useful information for better understanding of damage thresholds. Visible‐light radiation in the beam pipe generated by upstream bending magnets caused spurious reflections in the optical system of some of the imagers which can be suppressed by aluminium‐coated scintillating screens.

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“…In order to monitor intensity fluctuations originating from the beamline optics, intensity monitors are located at several points of the approximately 1 km long beam transport in the SASE2 tunnels. Two absolute calibrated X-ray intensity gas monitors (XGMs) (Grü nert et al, 2019;Maltezopoulos et al, 2019) are placed at the beginning of the SASE2 beamline (SA2_XGM) and inside the HED branch (HED_XGM). SA2_XGM measures the intensity of the X-ray pulses immediately after the undulators and HED_XGM gives the intensity values just before the beam enters the optics hutch.…”

Section: Intensity Monitoring and Scanningmentioning

confidence: 99%

Novel experimental setup for megahertz X-ray diffraction in a diamond anvil cell at the High Energy Density (HED) instrument of the European X-ray Free-Electron Laser (EuXFEL)

Liermann¹,

Konôpková²,

Appel³

et al. 2021

J Synchrotron Radiat

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The high-precision X-ray diffraction setup for work with diamond anvil cells (DACs) in interaction chamber 2 (IC2) of the High Energy Density instrument of the European X-ray Free-Electron Laser is described. This includes beamline optics, sample positioning and detector systems located in the multipurpose vacuum chamber. Concepts for pump–probe X-ray diffraction experiments in the DAC are described and their implementation demonstrated during the First User Community Assisted Commissioning experiment. X-ray heating and diffraction of Bi under pressure, obtained using 20 fs X-ray pulses at 17.8 keV and 2.2 MHz repetition, is illustrated through splitting of diffraction peaks, and interpreted employing finite element modeling of the sample chamber in the DAC.

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Operation of X-ray gas monitors at the European XFEL

Cited by 49 publications

References 21 publications

Megahertz single-particle imaging at the European XFEL

Megahertz single-particle imaging at the European XFEL

Operation of photon diagnostic imagers for beam commissioning at the European XFEL

Novel experimental setup for megahertz X-ray diffraction in a diamond anvil cell at the High Energy Density (HED) instrument of the European X-ray Free-Electron Laser (EuXFEL)

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