1994
DOI: 10.1149/1.2054901
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Open‐Circuit Photovoltage and Charge Recombination at Semiconductor/Liquid Interfaces

Abstract: A simple, quantitative relationship between the semiconductor surface recombination velocity (Sr) and the open-circuit photovoltage (Voc) of photoelectrochemical systems was derived and verified experimentally. Experimental results obtained for the n-Si/acetone-FeCp~/~ junction indicate that Voo is controlled by surface recombination. Quantitative analysis of the results using the derived expression yields values of the barrier height and Sr that compare favorably with published data. Application of the equati… Show more

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Cited by 13 publications
(13 citation statements)
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“…where z is the number of electrons involved in the reaction; in this case, z equals 14. 104 In this case, E oc is expected to decrease with increasing concentration of oxidized species which is the same result obtained with the model presented in this paper.…”
Section: ) Electrode Preparationsupporting
confidence: 87%
See 1 more Smart Citation
“…where z is the number of electrons involved in the reaction; in this case, z equals 14. 104 In this case, E oc is expected to decrease with increasing concentration of oxidized species which is the same result obtained with the model presented in this paper.…”
Section: ) Electrode Preparationsupporting
confidence: 87%
“…Other models exist that explain charge recombination process at semiconductor/liquid interfaces. 104 For non-ideal semiconductor/liquid junctions, when [1] the Fermi-level is pinned at semiconductor/liquid junctions where the barrier height is invariant with the concentration of redox species and [2] the interfacial charge transfer controls the recombination current, the open-circuit photovoltage can be described as…”
Section: ) Theoretical Modelsmentioning
confidence: 99%
“…All electrodes were etched, prior to use, with HF solution (49% by mass), as shown earlier [16]. The electrode was immersed in the HF solution for about 20 s, rinsed with distilled water, and then washed with methanol.…”
Section: Electrode Fabricationmentioning
confidence: 99%
“…43,45 Voc/E 0 ' < 1 can be ascribed to defects present at the semiconductor/liquid interface. 32,43 Given that all redox couples' concentrations were approximately equal for reduced and oxidized species and across the electrolytes, Voc/E ≈ Voc/E 0 '. 45 The J-V data in Figure 8 and on pages 22-24 are consistent with the following explanations: 1) a Schottky-junction at the p-type QD solid/electrolyte interface (see Figure 4), 2) a rectifying junction at an FTO/n-type QD solid interface, and 3) partial n-type doping of the QD solid to yield a buried p-n junction.…”
Section: A) Results and Discussionmentioning
confidence: 99%
“…shown to affect open-circuit voltages by allowing for unwanted charge-carrier recombination within light absorbing material. [32][33][34][35] For PbS QD solids, specifically, it has been shown that non-optimal QD surface chemistry leads to, among other things, greater densities of sub-bandgap states. 36 Surface defects affect the performance of photovoltaic devices through charge-carrier recombination, but also through Fermi-level pinning.…”
Section: Ii) Introductionmentioning
confidence: 99%