1994
DOI: 10.1016/0925-9635(94)90285-2
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Open-circuit mode drift mobility measurements in DLC films

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Cited by 21 publications
(9 citation statements)
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“…6 UNCD appears to be an intriguing material. Nitrogen has been shown to reduce the resistivity of amorphous carbons such as "diamondlike carbon" and "tetrahedrally bonded carbon" (ta-C) in the past, but the resulting mobility values were generally in the 10 −6 cm 2 V −1 s −1 range, 14,15 i.e., six orders of magnitude lower than this case and undetectable by the Hall effect. In single crystal and microcrystalline diamond, nitrogen is a substitutional donor with activation energy of 1.7 eV, 10 but can also form complexes (such as the N -V center) 16 which generally result in deep traps or compensation of any conductivity.…”
mentioning
confidence: 97%
“…6 UNCD appears to be an intriguing material. Nitrogen has been shown to reduce the resistivity of amorphous carbons such as "diamondlike carbon" and "tetrahedrally bonded carbon" (ta-C) in the past, but the resulting mobility values were generally in the 10 −6 cm 2 V −1 s −1 range, 14,15 i.e., six orders of magnitude lower than this case and undetectable by the Hall effect. In single crystal and microcrystalline diamond, nitrogen is a substitutional donor with activation energy of 1.7 eV, 10 but can also form complexes (such as the N -V center) 16 which generally result in deep traps or compensation of any conductivity.…”
mentioning
confidence: 97%
“…The field dependence of conductivity and/or mobility was also observed in amorphous and hydrogenated carbon layers 25–27. Foulani et al 25 observed a relatively strong increase of electron mobility in hydrogenated carbon, especially in the layers with low graphite content at room temperature.…”
Section: Introductionmentioning
confidence: 95%
“…They found the field‐activated mobility showed a temperature dependence decreasing with increasing field strength, interpreted by assuming two exponential trap distributions. Mycielski et al 27 measured electron mobility in diamond‐like carbon layers. In summary, the obtained drift mobility values were of the order of 10 −8 –10 −6 cm 2 V −1 s −1 and the field dependence was weaker than in a‐SiH.…”
Section: Introductionmentioning
confidence: 99%
“…The significant findings in our previous work [31] on DLCbased CS-TENG provided us the necessary groundwork to investigate the DLC sliding-TENG attributing to its outstanding tribological, mechanical, and insulating characteristics of DLC films [32][33][34][35][36][37][38][39][40][41]. Apart from its well-known tribological and mechanical properties, DLC films possess high surface electrical resistivity ranging between 10 2 -10 16 Ω-m [42], low electron mobility (10 −11 -10 −12 cm 2 /V) owing to its amorphous nature, wide bandgap (1 -4 eV) [43] and high defect state density thus making the DLC film an ideal candidate for energy harvesting through contact electrification.…”
Section: Introductionmentioning
confidence: 99%