2020 IEEE International Reliability Physics Symposium (IRPS) 2020
DOI: 10.1109/irps45951.2020.9129620
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Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash

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Cited by 13 publications
(1 citation statement)
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“…To further reduce the number of learned segments, LeaFTL performs optimizations to improve its learning efficiency of address mappings by exploiting the flash block allocation in SSD controllers, as shown in Figure 7. Flash pages are usually buffered in the SSD controller and written to flash chips at a flash block granularity, for utilizing the internal bandwidth and avoiding the open-block problem [6,22,37,48]. This allows LeaFTL to learn more space-efficient index segments (i.e., index segments can cover more LPA-PPA mappings) by reordering the flash pages with their LPAs in the data buffer.…”
Section: Improve the Learning Efficiencymentioning
confidence: 99%
“…To further reduce the number of learned segments, LeaFTL performs optimizations to improve its learning efficiency of address mappings by exploiting the flash block allocation in SSD controllers, as shown in Figure 7. Flash pages are usually buffered in the SSD controller and written to flash chips at a flash block granularity, for utilizing the internal bandwidth and avoiding the open-block problem [6,22,37,48]. This allows LeaFTL to learn more space-efficient index segments (i.e., index segments can cover more LPA-PPA mappings) by reordering the flash pages with their LPAs in the data buffer.…”
Section: Improve the Learning Efficiencymentioning
confidence: 99%