Abstract:An accurate prediction of remaining useful lifetime (RUL) in high reliability and safety electronic systems is required due to its wide use in industrial applications. In this paper, we propose a novel methodology for online RUL prediction, using support vector regression (SVR) model. Through Cadence simulations with 22nm CMOS technology library, we demonstrate that frequency degradation follows a trackable path and depends on temperature, voltage and aging. This characteristic is exploited for training the SV… Show more
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