Online Monitoring Method for SiC MOSFET Gate Oxide Degradation Based on Gate Voltage Filtering

Liu, Jiahong; Yao, Bo; Wei, Xing; Zhang, Yichi; Wang, Huai

doi:10.1109/apec48139.2024.10509036

2024 IEEE Applied Power Electronics Conference and Exposition (APEC) 2024

DOI: 10.1109/apec48139.2024.10509036

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Online Monitoring Method for SiC MOSFET Gate Oxide Degradation Based on Gate Voltage Filtering

Jiahong Liu,

Bo Yao,

Xing Wei

et al.

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Online Monitoring Method for SiC MOSFET Gate Oxide Degradation Based on Gate Voltage Filtering

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References 21 publications

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