2018
DOI: 10.1002/pip.3066
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One‐type‐fits‐all‐systems: Strategies for preventing potential‐induced degradation in crystalline silicon solar photovoltaic modules

Abstract: In this work, we investigate the relationship between potential‐induced degradation (PID) and the bill of material used in module manufacturing. We manufacture samples with different combination of materials, using two types of solar cells (conventional vs PID‐free c‐Si cells), two types of ethylene‐vinyl acetate (EVA) films with low/high resistivity, and two types of backsheets with, respectively, low/high breathability properties, and subject the mini‐modules to extended PID testing. Our results clearly indi… Show more

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Cited by 24 publications
(20 citation statements)
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References 20 publications
(37 reference statements)
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“…Indeed, Section S6 shows 1,000× greater volumetric resistivity for the POE (2.6 × 10 15 Ωcm) compared to the EVA (1.4 × 10 12 Ωcm) used in this study, which should result in greater PID resistance for the POE‐containing modules. Upon saturating the encapsulants in moisture, we observed no significant difference within the experimental error for the volume resistivity of saturated POE (4.3 × 10 15 Ωcm), while that of saturated EVA decreased slightly (4.6 × 10 11 Ωcm) consistent with the literature 39 . These results suggest that the PID degradation modes that we observe were likely unaffected by extended exposure to damp heat for POE modules, while moisture uptake by the encapsulant could worsen PID effects in EVA.…”
Section: Resultssupporting
confidence: 90%
See 1 more Smart Citation
“…Indeed, Section S6 shows 1,000× greater volumetric resistivity for the POE (2.6 × 10 15 Ωcm) compared to the EVA (1.4 × 10 12 Ωcm) used in this study, which should result in greater PID resistance for the POE‐containing modules. Upon saturating the encapsulants in moisture, we observed no significant difference within the experimental error for the volume resistivity of saturated POE (4.3 × 10 15 Ωcm), while that of saturated EVA decreased slightly (4.6 × 10 11 Ωcm) consistent with the literature 39 . These results suggest that the PID degradation modes that we observe were likely unaffected by extended exposure to damp heat for POE modules, while moisture uptake by the encapsulant could worsen PID effects in EVA.…”
Section: Resultssupporting
confidence: 90%
“…(2) greater bulk conductivity as well as ionic transport of species such as Na+ for EVA encapsulants compared to POE, resulting in stronger PID effects. 8,[36][37][38] Indeed, Section S6 shows 1,000Â greater volumetric resistivity for the POE (2.6 Â 10 15 Ωcm) compared to the EVA 39 These results suggest that the PID degradation modes that we observe were likely unaffected by extended exposure to damp heat for POE modules, while moisture uptake by the encapsulant could worsen PID effects in EVA.…”
Section: Current-voltage Characteristicsmentioning
confidence: 56%
“…Furthermore, PVB chemistries have continued to evolve with excellent moisture ingress resistance properties that—possibly—do not require edge sealing compounds any longer. A potential drawback of PVB is its low volume resistivity that could make modules manufactured with this polymer particularly prone to the occurrence of PID unless the proper mitigation strategies (eg, grounding of negative pole) are adopted.…”
Section: Discussionmentioning
confidence: 99%
“…Several degradation modes have in fact been reported leading to severe and accelerated losses in performance, already in the early system life. These include, as an example, potential-induced degradation (PID) [17] that can occur in the very first months or years of operation, glass breakage, junction-box failure, or back-sheet cracking [18] that may appear (and rapidly evolve) already after a few years of operation if the wrong polymeric materials are used. This tells us that the initial assumption (i.e., fulfilled module performance warranties over 30 years), besides being a reasonable target for the mature solar PV technology, is on the other hand a sort of best-case scenario with a limited but concrete probability that these warranties are not fulfilled.…”
Section: Severe Module Degradation and Replacementmentioning
confidence: 99%