2015
DOI: 10.1063/1.4906878
|View full text |Cite
|
Sign up to set email alerts
|

One dimensional semiconductor nanostructures: An effective active-material for terahertz detection

Abstract: One-dimensional (1D) nanostructure devices are at the frontline of studies on future electronics, although issues like massive parallelization, doping control, surface effects, and compatibility with silicon industrial requirements are still open challenges. The recent progresses in atomic to nanometer scale control of materials morphology, size, and composition including the growth of axial, radial, and branched nanowire (NW)-based heterostructures make the NW an ideal building block for implementing rectifyi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
20
0

Year Published

2015
2015
2019
2019

Publication Types

Select...
6
1

Relationship

3
4

Authors

Journals

citations
Cited by 18 publications
(20 citation statements)
references
References 34 publications
(43 reference statements)
0
20
0
Order By: Relevance
“…A second hBN flake, serving as passivation layer and, simultaneously, as top‐gate isolating dielectric, was then transferred on the hBN‐BP stack using the deterministic PVA method. The gate (G) electrode, patterned in shape of a split bow‐tie arm (Figure c), was deposited on the top of the hBN‐BP‐hBN stack via thermal evaporation of a 10/150 nm Cr/Au layer. We devised two sets of samples exploiting a different crystallographic orientation of the BP flake.…”
Section: Methodsmentioning
confidence: 99%
“…A second hBN flake, serving as passivation layer and, simultaneously, as top‐gate isolating dielectric, was then transferred on the hBN‐BP stack using the deterministic PVA method. The gate (G) electrode, patterned in shape of a split bow‐tie arm (Figure c), was deposited on the top of the hBN‐BP‐hBN stack via thermal evaporation of a 10/150 nm Cr/Au layer. We devised two sets of samples exploiting a different crystallographic orientation of the BP flake.…”
Section: Methodsmentioning
confidence: 99%
“…This work can be extended for the observation of maximum frequency of oscillation f max . This device modeling can be further analyzed for various THz radiation detectors [20][21][22]. In continuation with above, this Si based DG MOSFET can be combination of high-k dielectric materials.…”
Section: Conclusion and Future Recommendationsmentioning
confidence: 98%
“…To date, light detection at THz frequency in nanoscale FETs has been demonstrated to occur via the rectification of plasma waves in the transistor channel, induced by the external ac electric field . When an electromagnetic beam is coupled between the source (S) and the gate (G) electrodes, it excites carrier density oscillations, which, in turn, generate a driving longitudinal electric field through the channel.…”
mentioning
confidence: 99%
“…In the physical regime in which the detection mechanism is mediated by the rectification operated by the self‐mixing of overdamped charge density waves, the transfer characteristics allow predicting the expected generated photovoltage, which is proportional to: ΔunormalTnormal1σdσdVnormalG[RnormalLnormal1σ+RnormalL]where the minus sign accounts for the hole majority carriers, and in which loading effects arising from the finite impedance ( R L ) of the measurement setup have been properly included.…”
mentioning
confidence: 99%