This paper presents two feeding techniques for the radiation characterization of integrated antennas at millimeter-wave frequencies. The first method involves feeding the antenna-under-test (AUT) with a radiofrequency (RF) probe. We compare the measurements obtained with a standard RF probe, an extended probe, and an extended probe with reversed connector orientation. We find that the reversed orientation probe produces the best results in terms of effective measurement angular sector and reduction of ripples due to diffraction. The second method involves feeding the AUT through a flexible transmission line. This method achieves a larger range of measurement angles, but still suffers from parasitic scattering likely due to the mounting bracket and still need further development.There is an increasing demand for high-data-rate wireless networks and the 60 GHz band is a good candidate for these applications. At 60 GHz band, a net data-rate of multi-gigabit per second can be achieved over short distances [1]. Examples of applications are wireless gigabit Ethernet [2] or short-range wireless multimedia applications [3]. Recently, with the emergence of low-cost CMOS technologies operating at millimeter wavelengths, fully integrated front-ends with low-directivity antennas on Silicon On Insulator (SOI) substrates have been studied intensively [4,5]. The size of such antennas is frequently smaller or of the order of 1 mm in dimension, and therefore is much smaller than modern probing devices. Thus, their radiation performance is difficult to characterize as they are perturbed by their testing environment such as radiofrequency (RF) probes, connecting bond wires and transmission lines (t-lines).Several 3D radiation pattern measurement benches have been developed previously [6][7][8][9][10][11][12][13][14][15][16][17]. The basic feeding technique uses an RF probe to have a direct contact with the on-chip antenna [6][7][8]. However, as a standard probe device is much bigger and close to the AUT, it involves a limitation of the angular sector where measurements can be taken. Furthermore, it is metallic, which adds diffraction effects to the radiation pattern. To counteract this, a microwave absorbing material can be placed on the probe station metal surfaces. However, in view of the size of a probe, the absorber can cause even more masking effect on the radiation pattern. In [17], Mohammadpour-Aghdam et al. designed an antenna with contacts in the backside of the antenna's ground plane so that the RF probe did not alter the radiation pattern. However, this configuration is not applicable to most on-chip integrated antennas, which have the radiating element and the contact on the same metal layers.One approach to improve the performance of these measurement techniques is to supply the AUT with a long feed line to extend the distance between the probe and the AUT. The feed line can be integrated into the same substrate as the AUT, as in [9,11], or it can be connected to the AUT via bond wires, as in [18]. One advantage of usi...