2022
DOI: 10.48550/arxiv.2203.11712
|View full text |Cite
Preprint
|
Sign up to set email alerts
|

On the use of multilayer Laue lenses with X-ray Free Electron Lasers

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 0 publications
0
2
0
Order By: Relevance
“…One way to achieve this is with extreme focusing, but this requires high-quality X-ray optics such as MLLs. The first experiment in which MLLs were used to focus XFEL beams was performed at the European XFEL facility [4,5]. These MLLs were based on tungsten carbide (WC) and silicon carbide (SiC) multilayers [6].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…One way to achieve this is with extreme focusing, but this requires high-quality X-ray optics such as MLLs. The first experiment in which MLLs were used to focus XFEL beams was performed at the European XFEL facility [4,5]. These MLLs were based on tungsten carbide (WC) and silicon carbide (SiC) multilayers [6].…”
Section: Introductionmentioning
confidence: 99%
“…However, most of the experiments are usually done with lower frequency (1-2 MHz). In the aforementioned experiment [4,5], the incident XFEL beam was pre-focused with compound refractive lenses to ~300 µm and additionally reduced with slits to 100 µm x 100 µm. This size matched the dimensions of MLLs.…”
Section: Introductionmentioning
confidence: 99%