On the Structure of Amorphous Films

Chaudhari, P.; Graczyk, J. F.; Herd, S. R.

doi:10.1007/978-1-4684-0850-8_3

Cited by 4 publications

(7 citation statements)

References 6 publications

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“…3) and we have so far failed to find any, despite trying a considerable number of other orientations of the cluster. This result seems to be at variance with the conclusions of Chaudhari & Graczyk (1974) who have been able to find fringes for a special orientation of the Polk cluster. If fringes occur it must be for only a rather restricted range of orientations and they may also be rather sensitive to the shape, size and position of the aperture.…”

Section: Bright-field Images Computed For Single Clusterscontrasting

confidence: 50%

“…Rudee (1971) suggested that the ~ 15 A~ diameter bright spots which he observed in dark-field images of amorphous Ge originated from crystallites in the film and the observation of small groups of fringes in tilted bright-field interference pictures was interpreted on the same basis (Rudee & Howie, 1972). On the other hand Chaudhari and coworkers (Chaudhari, Graczyk & Herd, 1972;Chaudhari, Graczyk & Charbnau, 1972;Chaudhari & Graczyk, 1974;Graczyk & Chaudhari, 1973a, b, c) have obtained somewhat similar results and interpreted them in terms of a random-network model.…”

Section: Introductionmentioning

confidence: 74%

“…This cluster has also been investigated from the diffraction point of view by Chaudhari & Graczyk (1974).…”

Section: Cluster Modelsmentioning

confidence: 99%

“…If fringes occur it must be for only a rather restricted range of orientations and they may also be rather sensitive to the shape, size and position of the aperture. Chaudhari & Graczyk (1974) used a rectangular aperture rather than the circular aperture used here.…”

Section: Bright-field Images Computed For Single Clustersmentioning

confidence: 99%

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Kinematical theory of images from polycrystalline and random-network structures

Krivanek¹,

Howie²

1975

J Appl Cryst

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Kinematical electron microscope images to be expected from the Polk continuous random-network model and from a polycrystalline cluster have been computed. Dark-field images of both models show qualitatively similar speckle patterns. Fringes are observed in bright-field images of thin polycrystals (t< 40/~), but they disappear in thicker samples and are not observed in any of the Polk-model images. The experimental observation of fringes therefore cannot be explained by the current theory, possibly because it does not take account of the angular spread of illumination. Except perhaps in very thin specimens, it seems impossible at present to draw any reliable conclusions about the local atomic arrangement in amorphous materials by simple examination of electron micrographs.

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Section: Bright-field Images Computed For Single Clusterscontrasting

confidence: 50%

Section: Introductionmentioning

confidence: 74%

“…This cluster has also been investigated from the diffraction point of view by Chaudhari & Graczyk (1974).…”

Section: Cluster Modelsmentioning

confidence: 99%

Section: Bright-field Images Computed For Single Clustersmentioning

confidence: 99%

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Kinematical theory of images from polycrystalline and random-network structures

Krivanek¹,

Howie²

1975

J Appl Cryst

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“…In principle, the electron microscope allows direct visualization of the structure in thin foils and appeared to offer additional insights. Early papers, apparently showing evidence for lattice planes in bright-and darkfield images, were later shown to be probable statistical effects of the image-formation process (Chaudhari & Graczyk, 1973). The most severe problem identified in this process was not the limited resolution of the electron microscope but the projection required through the typical thin samples used.…”

Section: Introductionmentioning

confidence: 99%

Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials

Treacy¹,

Gibson²

1996

Acta Crystallogr A Found Crystallogr

203

161

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Variable coherence microscopy, a tool for quantitative analysis of structural fluctuations in disordered materials, is introduced. The method involves transmission electron microscopy of thin films and uses hollow-cone illumination. Experiments were performed on annealed evaporated amorphous germanium. Although many aspects of the data agree with the continuous random network model, there is experimental evidence for additional medium-range structure on the 10-20 A scale.

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Amorphous semiconductors: Structural models

Nag

Gupta

1982

Bull. Mater. Sci.

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The structure of amorphous semiconductors has become the subject of intense study in recent years. In this paper, the models, that have been constructed and applied to represent the structures, have been briefly reviewed. Details of the construction of continuous random network (CRN) models have been presented and a comparative study of the microcrystallite model and the random network model has been made in the light of their recent applications.

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On the Structure of Amorphous Films

Cited by 4 publications

References 6 publications

Kinematical theory of images from polycrystalline and random-network structures

Kinematical theory of images from polycrystalline and random-network structures

Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials

Amorphous semiconductors: Structural models

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