2015 19th International Conference on System Theory, Control and Computing (ICSTCC) 2015
DOI: 10.1109/icstcc.2015.7321394
|View full text |Cite
|
Sign up to set email alerts
|

On the stability domain of a DC-DC buck converter with software control loop

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2017
2017
2020
2020

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(3 citation statements)
references
References 13 publications
0
3
0
Order By: Relevance
“…Due to the progress of computational power of computer systems this is no longer a limiting factor. Over a period of time, the D-decomposition technique has been modified and improved [34][35][36][37][38]. For instance, it can take into account constraints such as gain and phase margins [39], yet works showing applications of the D-decomposition technique to the mechatronic system are rare in the literature.…”
Section: Introductionmentioning
confidence: 99%
“…Due to the progress of computational power of computer systems this is no longer a limiting factor. Over a period of time, the D-decomposition technique has been modified and improved [34][35][36][37][38]. For instance, it can take into account constraints such as gain and phase margins [39], yet works showing applications of the D-decomposition technique to the mechatronic system are rare in the literature.…”
Section: Introductionmentioning
confidence: 99%
“…Several studies have been conducted to estimate the circuit model in electronic testing research using black-box modeling through a system identification (SI) technique and artificial intelligence (AI) [4]- [8]. However, these studies have not focused on FRD for a power management circuit, such as the failure region of an LVR [9]- [14].…”
Section: Introductionmentioning
confidence: 99%
“…Much research have been done to test and analyse the analog circuit without knowing the exact model of the circuit under test, such as through transfer coefficient based [14]- [16] and black-box modelling [17]. Some work also have been conducted to estimate the failure region boundary of analog circuit [18]- [20]. In addition, most research on capacitor ESR only concentrates for the purpose of condition monitoring and fault diagnosis [21]- [23].…”
Section: Introductionmentioning
confidence: 99%