2021
DOI: 10.1016/j.mtphys.2021.100471
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On the role of Mg content in Mg2(Si,Sn): Assessing its impact on electronic transport and estimating the phase width by in situ characterization and modelling

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Cited by 13 publications
(12 citation statements)
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References 45 publications
(53 reference statements)
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“…Nevertheless, a far more important point to ensure long-term TEG performance is the material stability. It has been already shown that the n-type TE properties are very sensitive to Mg evaporation, which greatly alters the carrier concentration [27,30,[55][56][57]. The investigation of suitable coating and annealing conditions should therefore be prioritized for further TEG development, see, e.g., Refs.…”
Section: Discussionmentioning
confidence: 99%
“…Nevertheless, a far more important point to ensure long-term TEG performance is the material stability. It has been already shown that the n-type TE properties are very sensitive to Mg evaporation, which greatly alters the carrier concentration [27,30,[55][56][57]. The investigation of suitable coating and annealing conditions should therefore be prioritized for further TEG development, see, e.g., Refs.…”
Section: Discussionmentioning
confidence: 99%
“…observed for Mg 3 Sb 2 and Mg 2 Si systems, where going from Mg-rich to Mg-poor can change the carrier concentration by $10 20 cm À3 and even switch polarity. 33,35,[51][52][53][54] This indicates that (at least with the employed synthesis approach) the carrier concentration range of single phase MgAg 0.97 Sb 0.995 is relatively narrow and the phase width is hence small or the compensation between different defect types is strong.…”
Section: Synthesis Process Optimization: Reproducible Resultsmentioning
confidence: 99%
“…[27][28][29][30][31] This was found to be particularly true for Mg-based materials like Mg 2 (Si,Sn) and Mg 3 (Sb,Bi) 2 , where Mg-related intrinsic defects govern the carrier mobility and charge carrier concentration to an extent that this can be used to select the majority carrier type. [32][33][34][35] For MgAgSb, the main phase properties are likewise governed by intrinsic defects, e.g. Ag vacancies, Ag antisite defects on Mg sites, Sb vacancies [36][37][38] whose concentrations are linked to minimal changes in the composition.…”
Section: Introductionmentioning
confidence: 99%
“…The Mg element was chosen as the priority in the Cu-based TEiM to create an Mg overcompensation environment to enhance stability, considering the susceptibility to Mg deficiency in Mg 2 (Si, Ge, Sn) TEcM. [22][23][24][25][26][27] While a suitable interdiffusion at the TEiM/TEcM interface is necessary for robust interface bonding, [9] if the diffusion is too abrupt, it would result in instability during the service. Given the instability exhibited by the Cu/Mg 2 Sn 0.75 Ge 0.25 interface at elevated temperatures, an element with appreciative diffusion was required, which was also less reactive with Mg 2 (Si, Sn)-based TEcM.…”
Section: Design Of the Teimmentioning
confidence: 99%