On the Robustness of CMOS-Chopped Operational Amplifiers to Conducted Electromagnetic Interferences

Lavarda, Andrea; Petruzzi, Luca; Radez, Nejc; Deutschmann, Bernd

doi:10.1109/temc.2017.2729781

Cited by 7 publications

(9 citation statements)

References 14 publications

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“…Several studies are reported in the literature that describe the EMI susceptibility of analog ICs, [1][2][3][4][5][6][7][8][9][10][11]; it has been modeled and verified with simulations and experiments [12][13][14][15]. These works also consider very high frequencies [12][13][14], or are based on neural networks [13].…”

Section: Introductionmentioning

confidence: 99%

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A Comprehensive Comparison of EMI Immunity in CMOS Amplifier Topologies

et al. 2019

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This paper provides the results of a comprehensive comparison between complementary metal oxide semiconductor (CMOS) amplifiers with low susceptibility to electromagnetic interference (EMI). They represent the state-of-the-art in low EMI susceptibility design. An exhaustive scenario for EMI pollution has been considered: the injected interference can indeed directly reach the amplifier pins or can be coupled from the printed circuit board (PCB) ground. This is also a key point for evaluating the susceptibility from EMI coupled to the output pin. All of the amplifiers are re-designed in a United Microelectronics Corporation (UMC) 180 nm CMOS process in order to have a fair comparison. The topologies investigated and compared are basically derived from the Miller and the folded cascode ones, which are well-known and widely used by CMOS analog designers.

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Section: Introductionmentioning

confidence: 99%

“…These works also consider very high frequencies [12][13][14], or are based on neural networks [13]. Moreover, most of them focus on the operational amplifiers because of their high sensitivity to EMI and because they are the main building blocks in analog designs [1][2][3][4][5][6][7][8][9][10][11].…”

Section: Introductionmentioning

confidence: 99%

A Comprehensive Comparison of EMI Immunity in CMOS Amplifier Topologies

et al. 2019

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“…which are often used in such temperature monitoring systems often suffer from a high electromagnetic susceptibility [28,29]. In order to analyze the behavior of the over temperature monitoring under EMI of smart power high side switches, several commercially available automotive devices from different IC manufacturers were investigated.…”

Section: Fig 3 Temperature Sensor Circuit To Monitor the Temperaturmentioning

confidence: 99%

Impact of electromagnetic interference on the functional safety of smart power devices for automotive applications

Deutschmann

Winkler

Kastner

2018

Elektrotech. Inftech.

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Integrated smart power devices gain more and more importance in the field of automotive systems. In addition to power transistors such devices usually contain several integrated diagnostic and protection functions. In the event of a fault these functions enable the connected control unit to react appropriately and to protect the application and thus the people. Smart power devices are often responsible for important tasks within a vehicle and are nowadays more and more used to substitute conventional elements like fuses, relays and switches. During the operation they are often exposed to harsh environmental conditions such as high operating temperatures, mechanical stress, etc. At the same time different electromagnetic interferences (EMI) may occur, which can affect their normal functionality. Especially in safety-critical applications such as the airbag control module or the Anti-lock Braking System their correct function is very important to avoid dangerous operating conditions and to ensure functional safety. Based on EMI investigations on a representative smart power high side switch it is shown in this paper to what degree of electromagnetic interference smart power devices are still able to correctly detect critical fault conditions and remain in their fail-save state.

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“…In most EMI-robust opamp circuits proposed so far in the literature [26][27][28][29][30][31][32][33][34][35][36][37][38][39][40][41][42][43][44], a reduced susceptibility to EMI is achieved at integrated circuit level either by filtering or by filtered replica stages [29,30,[35][36][37]40,41,43], or by ad-hoc input differential stages, in which the EMI-induced offset voltage and the low-frequency demodulated components resulting from RF rectification are mitigated by active device degeneration [28,39], or ideally cancelled by compensating asymmetries in EMI propagation [30][31][32]38] or, finally, by the compensation of different nonlinear mechanisms [21,30,33,34,37,41,42].…”

Section: Introductionmentioning

confidence: 99%

“…In spite of many significant improvements observed in the last years [26][27][28][29][30][31][32][33][34][35][36][37][38][39][40][41][42][43] the EMI-robust opamp circuits presented to date still suffer of several limitations. First, EMI immunity invariably requires non-conventional topologies and careful ad hoc analog design; second, it can be easily impaired by process variations and device mismatch; third, it is often traded off with baseband performance and/or with chip area and power.…”

Section: Introductionmentioning

confidence: 99%

Digital Suppression of EMI-Induced Errors in a Baseband Acquisition Front-End including Off-the-Shelf, EMI-Sensitive Operational Amplifiers

Crovetti

Musolino

2021

Electronics

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In this paper, the susceptibility to Electromagnetic Interference (EMI) of an analog signal acquisition front-end (AFE) due to EMI distortion in opamp-based pre-conditioning amplifiers is addressed. More specifically, the possibility to correct EMI-induced errors in the digital domain by post-processing the acquired digital waveforms is discussed and experimentally demonstrated for the first time with reference to an AFE based on EMI-sensitive, off-the-shelf operational amplifiers mounted on a specific EMI test PCB. Extensive experimental characterization in the presence of continuous wave and amplitude modulated EMI reveals the superior immunity to EMI of the proposed AFE and the robustness of the approach.

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On the Robustness of CMOS-Chopped Operational Amplifiers to Conducted Electromagnetic Interferences

Cited by 7 publications

References 14 publications

A Comprehensive Comparison of EMI Immunity in CMOS Amplifier Topologies

A Comprehensive Comparison of EMI Immunity in CMOS Amplifier Topologies

Impact of electromagnetic interference on the functional safety of smart power devices for automotive applications

Digital Suppression of EMI-Induced Errors in a Baseband Acquisition Front-End including Off-the-Shelf, EMI-Sensitive Operational Amplifiers

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