2017
DOI: 10.1134/s1063739717080030
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On the Problem of Determining the Bulk Lifetime by Photoconductivity Decay on the Unpassivated Samples of Monocrystalline Silicon

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Cited by 7 publications
(2 citation statements)
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“…52 As charge carrier lifetime is typically defined as the statistical average time calculated by the recombination of electrons and holes through multiple pathways at different times, it is difficult to track individual charge carrier lifetimes. Thus, the lifetime (τ) has been inferred from PL, [53][54][55] photoconductance, 56,57 photovoltaic, 52,58 and photocatalytic 43,[59][60][61] properties, in which generation and recombination occur. The radiative (τ r −1…”
Section: Charge Separation Efficiencymentioning
confidence: 99%
“…52 As charge carrier lifetime is typically defined as the statistical average time calculated by the recombination of electrons and holes through multiple pathways at different times, it is difficult to track individual charge carrier lifetimes. Thus, the lifetime (τ) has been inferred from PL, [53][54][55] photoconductance, 56,57 photovoltaic, 52,58 and photocatalytic 43,[59][60][61] properties, in which generation and recombination occur. The radiative (τ r −1…”
Section: Charge Separation Efficiencymentioning
confidence: 99%
“…The electrophysical characteristics of semiconductor structures with an n + -p junction depend on the volume and surface recombination rates, the impurities and radiation defects distributions. The parameters of volume and surface recombination were measured by the photoconductivity decay method [7,8] . Methods for determining recombination parameters are being improved.…”
Section: Introductionmentioning
confidence: 99%