2020
DOI: 10.1016/j.rinp.2019.102821
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On the possibility of PhotoEmission Electron Microscopy for E. coli advanced studies

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Cited by 2 publications
(1 citation statement)
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“…Antipov et al conducted XPS measurements of E. coli on a silicon wafer, and the obtained results align with our bacterial samples shown in Figure S13. When only the silicon wafer was present, signals corresponding to C–Si bonds (283.2 eV), Si–O–Si bonds (532.8 eV), O KLL (978 eV), and C KLL (1228 eV) peaks were observed.…”
Section: Resultsmentioning
confidence: 99%
“…Antipov et al conducted XPS measurements of E. coli on a silicon wafer, and the obtained results align with our bacterial samples shown in Figure S13. When only the silicon wafer was present, signals corresponding to C–Si bonds (283.2 eV), Si–O–Si bonds (532.8 eV), O KLL (978 eV), and C KLL (1228 eV) peaks were observed.…”
Section: Resultsmentioning
confidence: 99%