On the New Design of a 4-Port TEM Waveguide with a Higher Cutoff Frequency and Wider Test Volume

Jeon, Sang Bong

doi:10.4218/etrij.12.0212.0022

Cited by 5 publications

(6 citation statements)

References 2 publications

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“…This kind of chamber or apparatus is very expensive at low frequency so it is a financial burden to the small-/medium-sized company and university. Or, the transverse electromagnetic mode (TEM) cell could be utilized [2], but it is an alternative apparatus for the fully-anechoic chamber.…”

Section: Introductionmentioning

confidence: 99%

Reactive near-field to near-/far-field transformation in semi-anechoic chamber

Lee

Jeon

et al. 2013

2013 Asia-Pacific Microwave Conference Proceedings (APMC)

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In this paper, the technique of the reactive nearfield to near-/far-field transformation has been proposed. The different thing compared with the previous work is that the environment of the semi-anechoic chamber with the ground plane was assumed during the transformation. The sources of electronic device are reconstructed from the detected reactive near-field. And then, the composite array source using the image theory is built, and then the transformation from the composite source to the near-/far-field are performed. For the verification, the simulated results have been utilized, and their results show small errors. Therefore, the proposed technique in this paper could be applied to predict the radiated field at 3 m or 10 m without the expensive large semi-anechoic chamber.

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Section: Introductionmentioning

confidence: 99%

Reactive near-field to near-/far-field transformation in semi-anechoic chamber

Lee

Jeon

et al. 2013

2013 Asia-Pacific Microwave Conference Proceedings (APMC)

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“…However, the TEM cell has some drawbacks of a limited frequency range and a test volume. To overcome these shortcomings, a new 4‐port TEM cell has been proposed by our group [4]. However, even with the increased frequency range and the test volume, it still produces unwanted field components inside the test volume, which is disadvantageous to both near‐ and far‐field test environments.…”

Section: Introductionmentioning

confidence: 99%

“…Introduction: Recently, various studies to suppress unwanted electromagnetic (EM) fields below a specific level of regulation have been continuously undertaken [1]. To address this problem, a transverse EM (TEM) cell is widely used as an alternative standard EM field generator in EM compatibility (EMC) tests [2][3][4][5]. However, the TEM cell has some drawbacks of a limited frequency range and a test volume.…”

mentioning

confidence: 99%

“…The upper septum is connected to ports 1 and 3, and the lower one is connected to ports 2 and 4 at each end. The usable test volume of the cell is a cube, which measures 250 mm 3 , and the cutoff (a TE01 mode) and the first resonant frequencies are 187.9 and 272.1 MHz, respectively [4]. In order to excite a TEM mode emulating a far-field environment, we apply input signals to ports 1 and 2 with the same amplitude and reversed phase, i.e.…”

mentioning

confidence: 99%

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Method to reduce an unwanted EM field component in a 4‐port TEM cell

Choi¹,

Jeon²,

Kim

et al. 2018

Electron. lett.

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As an alternative standard electromagnetic (EM) field generator, a 4‐port TEM (transverse EM) cell can be used for an EM compatibility (EMC) emission and immunity test. However, unwanted EM fields generated in a TEM cell deteriorate the results and accuracy of critical EMC tests. A new method to suppress unwanted field components in a 4‐port TEM cell is proposed. To reduce the unwanted EM field, the narrow slits in internal septa are inserted, which are transverse with respect to the direction of wave propagation. By introducing the slits, the 4‐port TEM cell can provide improved standard EM field distribution with the much‐lowered unwanted field component inside the usable test volume.

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“…Transverse electromagnetic (TEM) waveguides have been widely used as an alternative approach to perform an electromagnetic compatibility (EMC) test in a far‐field environment [1, 2]. However, many EMC issues are not confined to only far‐field problems.…”

Section: Introductionmentioning

confidence: 99%

Analysis of electromagnetic interference under different types of near‐field environments

et al. 2014

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The effect of different interferences on a victim wireless device in electric and magnetic near-field (NF) environments is investigated. Using a four-port transverse electromagnetic (TEM) cell, those NF environments are generated by varying wave impedance in the cell, which can be done by applying an external interference signal. As a measure of interference, the bit error rate performance of the victim device is chosen, which shows both NF environments have significant but distinctive interference effects on the victim device.Introduction: Transverse electromagnetic (TEM) waveguides have been widely used as an alternative approach to perform an electromagnetic compatibility (EMC) test in a far-field environment [1, 2]. However, many EMC issues are not confined to only far-field problems. In practice, many electronic devices coexist in a relatively small area belonging to a near-field (NF) region, which should also be carefully considered in modern EMC tests [3]. To configure a NF-like environment, several methods of manipulating wave impedance inside TEM waveguides have been reported [4][5][6]. However, to our knowledge, no practical interference problems have been dealt with.In this Letter, we quantify interference effects in two different electric and magnetic NF test environments. To do this we also provide a new way of generating the NF environments using a TEM cell. Through the experiment, we can show that the different NF environments have remarkable but distinctive effects on a victim device.

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On the New Design of a 4-Port TEM Waveguide with a Higher Cutoff Frequency and Wider Test Volume

Cited by 5 publications

References 2 publications

Reactive near-field to near-/far-field transformation in semi-anechoic chamber

Reactive near-field to near-/far-field transformation in semi-anechoic chamber

Method to reduce an unwanted EM field component in a 4‐port TEM cell

Analysis of electromagnetic interference under different types of near‐field environments

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