1996
DOI: 10.1016/0304-3991(95)00086-0
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On the many advantages of local-electrode atom probes

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Cited by 134 publications
(57 citation statements)
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“…SEM was performed on mounted samples polished to a 0.02 μm finish and etched in a 100 ml HCl/100 ml deionized H 2 O/1g K 2 S 2 0 5 mixture, employing a LEO Gemini 1525™ field-emission SEM operated at 5 kV with a 20-30 μm aperture and a working distance of 6 mm. APT was performed with a local-electrode atom-probe (LEAP™) tomograph [16][17][18][19] at the Northwestern University Center for Atom-Probe Tomography (NUCAPT). Pulsed-laser APT data collection was performed at a target evaporation rate of 0.04 ions per pulse, a specimen temperature of 40.0±0.3 K, a pulse energy of 0.6 nJ, a pulse repetition rate of 200 kHz, and a background gauge pressure of < 6.7 x 10 -8 Pa.…”
Section: Methodsmentioning
confidence: 99%
“…SEM was performed on mounted samples polished to a 0.02 μm finish and etched in a 100 ml HCl/100 ml deionized H 2 O/1g K 2 S 2 0 5 mixture, employing a LEO Gemini 1525™ field-emission SEM operated at 5 kV with a 20-30 μm aperture and a working distance of 6 mm. APT was performed with a local-electrode atom-probe (LEAP™) tomograph [16][17][18][19] at the Northwestern University Center for Atom-Probe Tomography (NUCAPT). Pulsed-laser APT data collection was performed at a target evaporation rate of 0.04 ions per pulse, a specimen temperature of 40.0±0.3 K, a pulse energy of 0.6 nJ, a pulse repetition rate of 200 kHz, and a background gauge pressure of < 6.7 x 10 -8 Pa.…”
Section: Methodsmentioning
confidence: 99%
“…APT and field-ion microscopy (FIM) experiments [25,26] were performed using conventional APT [27,28] and an Imago Scientific Instrument's LEAP tomograph [29]. Prior to conventional APT analysis, specimens were imaged at 40-50 K with FIM at background gauge pressures of neon that varied from 6.7 · 10 À4 to 2.6 · 10 À3 Pa (5 · 10 À6 to 2 · 10 À5 torr).…”
Section: Methodsmentioning
confidence: 99%
“…Recent developments of local electrode atom probes [1][2][3] open new opportunities for analysis of martensite decomposition at the atomic level. These modern instruments allow the collection of data in a shorter period of time from a larger volume of material compared to the previous generation atom probe field ion microscopes.…”
Section: Introductionmentioning
confidence: 99%