2011
DOI: 10.1016/j.mejo.2011.08.005
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On the investigation of a reliable actuation control method for ohmic RF MEMS switches

Abstract: Efficient control of RF MEMS switches is a very important issue as it is correlated to main failure mechanisms/modes such as the impact force and bouncing phenomena which degrade their dynamic performance and longevity. This paper presents the control of a specific ohmic RF MEMS switches under three different actuation modes, a tailored pulse optimization method based on Taguchi's technique (voltage mode actuation control), resistive damping (charge mode actuation control) and finally the Hybrid actuation mode… Show more

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Cited by 12 publications
(9 citation statements)
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References 18 publications
(22 reference statements)
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“…On the other hand, Do et al [3] developed an analytical method based on energy consideration for selecting the parameters of the dual pulse wave. Spasos and Nilavalan [11] presented description of two techniques to control bouncing: the charge control (resistive damping) and the voltage control. Voltage control is based on an open loop statistical method to control bouncing called the Taguchi's optimization technique.…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, Do et al [3] developed an analytical method based on energy consideration for selecting the parameters of the dual pulse wave. Spasos and Nilavalan [11] presented description of two techniques to control bouncing: the charge control (resistive damping) and the voltage control. Voltage control is based on an open loop statistical method to control bouncing called the Taguchi's optimization technique.…”
Section: Introductionmentioning
confidence: 99%
“…13,[94][95][96][97][98][99][100][101][102] In MEMS, switch designers have focused on suppressing or 'engineering away' contact bounce using mechanical switch designs or novel actuation signals that aim for near zero impact velocity of the electric contacts. [96][97][98][99][100][101][102] Peschot et al however, performed experiments to better explain contact bounce at the nanometer scale. 103 Using an AFM and a nano-indenter, the researchers controlled micro-contact make and break operations at low values of electrode velocity (few tens of nm s −1 ).…”
Section: Failure Modes and Reliabilitymentioning
confidence: 99%
“…The reaction force (F) balance the generated electrostatic force produced in beam structure. At two-third air gap, the switch beam becomes unstable and results in breakdown at the lower transmission line in down-state position [29][30][31][32][33][34]. The pull-in voltage be influenced by the value spring constant of beam shape, gap and electrode area [1,28].…”
Section: Principles and Operation Of Mems Rf Switchmentioning
confidence: 99%
“…Further, microstrip transmission may be considered as a two wire line and is further viewed the most extensively used as a planar microstrip transmission line [29][30][31]. One side of the design is free to access for mounting on the hymite or other packaged devices and further geometrical construction lends itself well to printed circuit board patterning methods to define the complete circuit.…”
Section: Design Of Transmission Linesmentioning
confidence: 99%
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