1986
DOI: 10.1007/bf00553379
|View full text |Cite
|
Sign up to set email alerts
|

On the influence of silicon on the growth of the alloy layer during hot dip aluminizing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

6
81
1
2

Year Published

1987
1987
2017
2017

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 146 publications
(100 citation statements)
references
References 4 publications
6
81
1
2
Order By: Relevance
“…These lightly pre-welded samples were then isothermally annealed in the temperature range 673 K to 843 K (400°C to 570°C ) for times increasing up to 8 hours. Metallographic cross sections were prepared from the welded and heat-treated samples by grinding and polishing, using standard techniques, before observation Bouayad et al [13] 74.1 1073 (800) pure Al*-pure Fe Denner and Jones [14] 170-195 1044 (771) pure Al*-Mild steel Eggeler et al [15] 34-155 1059 (786) pure Al*-Low carbon steel Naoi et al [6] 281 873-923 (600-650) pure Al-pure Fe Springer et al [3] 190 873 (600) pure aluminum-low-carbon steel Tang et al [16] 123 953-1043 (680-770) pure Al*-pure Fe by scanning electron microscopy (SEM) using a high-resolution FEI Magellan field emission gun (FEG) microscope. The average layer thickness was determined from the net area of the IMC layer divided by the interface length.…”
Section: Methodsmentioning
confidence: 99%
“…These lightly pre-welded samples were then isothermally annealed in the temperature range 673 K to 843 K (400°C to 570°C ) for times increasing up to 8 hours. Metallographic cross sections were prepared from the welded and heat-treated samples by grinding and polishing, using standard techniques, before observation Bouayad et al [13] 74.1 1073 (800) pure Al*-pure Fe Denner and Jones [14] 170-195 1044 (771) pure Al*-Mild steel Eggeler et al [15] 34-155 1059 (786) pure Al*-Low carbon steel Naoi et al [6] 281 873-923 (600-650) pure Al-pure Fe Springer et al [3] 190 873 (600) pure aluminum-low-carbon steel Tang et al [16] 123 953-1043 (680-770) pure Al*-pure Fe by scanning electron microscopy (SEM) using a high-resolution FEI Magellan field emission gun (FEG) microscope. The average layer thickness was determined from the net area of the IMC layer divided by the interface length.…”
Section: Methodsmentioning
confidence: 99%
“…The reactive diffusion between liquid Al and solid Fe or Fe-base alloys has been experimentally studied by many researchers. [62][63][64][65][66][67][68][69][70][71][72] In an experiment by Bouché et al, 69) Fe/Al diffusion couples were prepared by a melt bath technique, and then isothermally annealed at temperatures of 973-1173 K. A similar experiment was conducted by Bouayad et al 71) In the binary Fe-Al system, 1) FeAl 3 , Fe 2 Al 5 , FeAl 2 and FeAl are the stable compounds at these temperatures. According to their experimental results, 69,71) however, only Fe 2 Al 5 and FeAl 3 are formed as visible layers at the Fe/Al interface in the diffusion couple owing to annealing.…”
Section: Introductionmentioning
confidence: 99%
“…[56] Several studies revealed that in particular silicon (Si) additions to aluminum melts decelerate the growth and reduce the thickness of the IM layer forming on steel samples hot dipped into the melts. [36,40,[51][52][53][54] The same effect was observed in dissimilar welding of aluminum alloys with steel using Al-Si-based fillers. [10,19,57] Although the influence of silicon on the growth of the IM layer is still not completely understood, it is assumed that the diffusivity of aluminum atoms in the solid Al 5 Fe 2 phase is significantly reduced due to the occupation of vacancy sites by silicon atoms, [40,52] or that silicon reduces the activity coefficient of aluminum atoms in iron at the Al-Fe interface.…”
Section: Introductionmentioning
confidence: 79%
“…[36,40,[51][52][53][54] The same effect was observed in dissimilar welding of aluminum alloys with steel using Al-Si-based fillers. [10,19,57] Although the influence of silicon on the growth of the IM layer is still not completely understood, it is assumed that the diffusivity of aluminum atoms in the solid Al 5 Fe 2 phase is significantly reduced due to the occupation of vacancy sites by silicon atoms, [40,52] or that silicon reduces the activity coefficient of aluminum atoms in iron at the Al-Fe interface. [56] The main objective of this study was to investigate the influences of different filler alloy compositions and process parameters on the thickness of the IM layer.…”
Section: Introductionmentioning
confidence: 81%
See 1 more Smart Citation