2011
DOI: 10.1117/12.881586
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On the extensibility of extreme UV lithography

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“…The measured lattice contraction of 0.003 Angstroms is in the range of expected values for a saturated solution of silicon. Also in the 550 • C study, there was a Fe 3 Si (Gupeiite) 31 structure that formed rather than the Fe 3 Si found at the higher temperatures. The Gupeiite peak was differentiated from the FeSi (210) peak using the presence of the FeSi (211) peak.…”
Section: Resultsmentioning
confidence: 88%
“…The measured lattice contraction of 0.003 Angstroms is in the range of expected values for a saturated solution of silicon. Also in the 550 • C study, there was a Fe 3 Si (Gupeiite) 31 structure that formed rather than the Fe 3 Si found at the higher temperatures. The Gupeiite peak was differentiated from the FeSi (210) peak using the presence of the FeSi (211) peak.…”
Section: Resultsmentioning
confidence: 88%