On the design of measuring circuit for OCVD method
Václav Papež,
Jiří Hájek
Abstract:The article deals with the matter that is often omitted by authors – design of measuring circuit. The most of publications describe theoretical background of the OCVD method or they interpret results obtained on modern SiC or 4H-SiC structures. But correct and relevant results are conditioned by corresponding measuring circuit. Even if the OCVD method is based “just” on recording of voltage response, measuring circuit must fulfill a lot of requirements from high-frequency techniques. Following article tries to… Show more
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