On the Calibration Process of Automatic Network Analyzer Systems (Short Papers)

Abstract. The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if the substrate material or the planar transmission lines on the substrate changes, a new calibration is necessary. In this paper a method will be examined, which reduces the number of calibration cycles by using a database. Analytical results show that by using this database method, errors occur which depend on the coupling coefficients and on the load impedances of the contactless probes. However, the measurement results show deviations smaller than 7% in comparison to the conventional vector network analysis, which is sufficient for the most pratical applications.

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“…At first the well-known one-port error box model of a reflectometer used by Rehnmark (1974) is shown as a flow graph in Fig. 2.…”

Section: The Database Methodsmentioning

confidence: 99%

Usage of the contactless vector network analysis with varying transmission line geometries

et al. 2008

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“…The RF input power is divided into two, with half being delivered to port 1 and half being used as a reference to resolve the relative amplitude and phase information at coupling ports A and R. To calibrate port 1 as a virtually perfect reflectometer, we employed the conventional three-term error model [15,16]. This model deals with three dominant and systematic error terms in an actual reflectometer, known as the directivity (e00), port match (e 11 ), and reflection tracking (e 10 e 01 ) errors at the port; these terms are readily extracted using Eq.…”

Section: ⅱ One-port Calibration With a Photonic Linkmentioning

confidence: 99%

“…7. The conventional error model for calibrating the forward one-path, two-port system is a five-term error model [15,16]. With a second port (port 2), transmission tracking (e10e32) and port 2 mismatch (e22) terms are added, as shown in Fig.…”

Section: Fig 8 Five-term Error Model For Two-port Calibration (A Thmentioning

confidence: 99%

Vector Network Analysis Using a One-Path, Frequency-Multiplied Photonic Link

Lee¹,

Kwon²,

Kang³

et al. 2010

Journal of electromagnetic engineering and science

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A simplified, practical vector network analyzer (VNA) that uses mature radio-over-fiber technology has been designed and demonstrated. The measurement concept allows the full S-parameters of a microwave device (or antenna) to be obtained while minimizing the detrimental effects of electrical cables, which are replaced with a photonic link. A variety of high-frequency light modulation schemes with frequency sweeping capabilities are presented to realize a one-path (single, forward), frequency-multiplied optical link for VNA applications. Using the photonic one-path link, full two-port S-parameters have been extracted based on five-term error modeling, which has half the error terms compared with the standard duplex configuration. The S-parameters of a microwave filter and antenna measured using frequency-multiplied optical links are found to be in good agreement with those obtained using a conventional VNA.

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“…All measurement and characterization steps were the same as Hackborn"s method, but the signal flow graph was analyzed node by node, resulting in explicit expressions for the DUT parameters. Later, in June 1973, Stig Rehnmark, using Kruppa and Sodomsky"s technique, would present an article with 292 explicit formulas using Hand"s model, thus giving explicit solutions for DUT parameters in the more sophisticated and more commonly used error model [48]. Kruppa Consider a cascade of two 2-port devices as shown in Appendix Fig.…”

Section: A57mentioning

confidence: 99%

Modeling and Testing of Ethernet Transformers

et al. 2009

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Twisted-pair Ethernet is now the standard home and office last-mile network technology. For decades, the IEEE standard that defines Ethernet has required electrical isolation between the twisted pair cable and the Ethernet device. So, for decades, every Ethernet interface has used magnetic core Ethernet transformers to isolate Ethernet devices and keep users safe in the event of a potentially dangerous fault on the network media. The current state-of-the-art Ethernet transformers are miniature (<5mm diameter) ferrite-core toroids wrapped with approximately 10 to 30 turns of wire. As small as current Ethernet transformers are, they still limit further Ethernet device miniaturization and require a separate bulky package or jack housing. New coupler designs must be explored which are capable of exceptional miniaturization or on-chip fabrication.This dissertation thoroughly explores the performance of the current commercial Ethernet transformers to both increase understanding of the device"s behavior and outline performance parameters for replacement devices. Lumped element and distributed circuit models are derived; testing schemes are developed and used to extract model parameters from commercial Ethernet devices. Transfer relation measurements of the commercial Ethernet transformers are compared against the model"s behavior and it is found that the tuned, distributed models produce the best transfer relation match to the measured data.Process descriptions and testing results on fabricated thin-film dielectric-core toroid transformers are presented. The best results were found for a 32-turn transformer loaded with 100Ω, the impedance of twisted pair cable. This transformer gave a flat response from about 10MHz to 40MHz with a height of approximately 0.45. For the fabricated transformer structures, theoretical methods to determine resistance, capacitance and inductance are presented. A special analytical and numerical analysis of the fabricated transformer inductance is presented. Planar cuts of magnetic slope fields around the dielectric-core toroid are shown that describe the effect of core height and winding density on flux uniformity without a magnetic core.

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On the Calibration Process of Automatic Network Analyzer Systems (Short Papers)

Cited by 103 publications

References 2 publications

Usage of the contactless vector network analysis with varying transmission line geometries

Usage of the contactless vector network analysis with varying transmission line geometries

Vector Network Analysis Using a One-Path, Frequency-Multiplied Photonic Link

Modeling and Testing of Ethernet Transformers

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