Manufacturing processes are usually monitored by making use of control charts for variables or attributes. Controlling both increases and decreases in a parameter, by using a control statistic with an asymmetrical distribution, frequently leads to an ARL-biased chart, in the sense that some out-of-control average run length (ARL) values are larger than the in-control ARL, i.e., it takes longer to detect some shifts in the parameter than to trigger a false alarm. In this paper, we are going to: