2020 IEEE International Reliability Physics Symposium (IRPS) 2020
DOI: 10.1109/irps45951.2020.9128967
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ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution

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Cited by 4 publications
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“…They refer to practical problems that scientific and research studies tend to solve. [24,113,116] Table 4 provides an exhaustive list of articles per domain of application. And, Fig.…”
Section: Application Domainsmentioning
confidence: 99%
“…They refer to practical problems that scientific and research studies tend to solve. [24,113,116] Table 4 provides an exhaustive list of articles per domain of application. And, Fig.…”
Section: Application Domainsmentioning
confidence: 99%