The DTA trace of the chalcogenide glass As2Se 3 9 AszTe 3 shows a single glass transition at 142 ~ a single crystallization exotherm depending on the heating rate, and two melting endotherms, at 290 '~C and 312 "C. The X-ray diffraction for a crystallized sample indicates the presence of two solid solution phases: Te in AszS % (rich in Se) and Se in AszT % (rich in Te), confirming that the single crystallization peak of the initially homogeneous phase (single 7~q) represents two coincident peaks superimposed. The crystallization of the glass phase is also clearly manifested in the time-dependence of the electrical conductivity and microphotography.The structure and properties of the stoichiometric chalcogenide glass As2Se 3 have been extensively studied. This compound may readily be prepared in the glassy state, having a definite structure containing only As-Se bonds [1]. Replacement of Se by Te in this compound leads to the formation of As Te bonds in place of As-Se bonds, and this affects all the structural properties. The degree of change depends on the Te content of the ternary compound AszSe3-As2Te 3 [2,3]. Such a dependence is linear for the valence bond concentration (As-Te or As-Se), hydrostatic density, dc conductivity and activation energy of conduction, and nonlinear for the Vickers hardness, while there is a discontinuity for the melting temperature, thermal conductivity and activation energy of crystallization. The discontinuity appears at equal proportions of Se and Te, where there is a dip at the composition As2Se 3 9 As2Te 3 .In this paper, the effects of thermal annealing on the electrical conduction and structural changes of the semiconductor glass AszSe3.AszTe 3 have been studied. The sample preparation and the measuring arrangements for DTA, X-ray diffraction and dc conductivity were described in previous publications [2 5].