On-line detection method based on optimal modified lateral shearing interferometry for evaluating the damage growth characteristics

Li, Jie; Ba, Rongsheng; Zhou, Xinda; Zheng, Yinbo; Ding, Lei; Chai, Liqun; Ren, Huaijin; Tang, Xiaodong

doi:10.7567/1347-4065/ab3de3

Cited by 2 publications

(2 citation statements)

References 32 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…However, along with the rapid development of computer processing technology, the accuracy and stability of the wavefront measurement methods are proposed higher requirements. Lateral shearing interferometry (LSI) technology has become an effective tool in wavefront measurement due to its unique advantage that it does not require an ideal reference wavefront [2][3][4][5][6][7][8]. In recent years, researchers have presented many types of LSI wavefront measurement methods and have also applied different technologies to LSI design [1,3,4,6,[8][9][10].…”

Section: Introductionmentioning

confidence: 99%

“…Lateral shearing interferometry (LSI) technology has become an effective tool in wavefront measurement due to its unique advantage that it does not require an ideal reference wavefront [2][3][4][5][6][7][8]. In recent years, researchers have presented many types of LSI wavefront measurement methods and have also applied different technologies to LSI design [1,3,4,6,[8][9][10]. Among them, polarization phase-shifting technology is one of the most effective methods for improving accuracy in LSI, especially in terms of the spatial phase-shifting simultaneous acquisition, it shows the advantages of simplicity, reliability, and small errors [7,11,12].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Simultaneous two-step phase-shifting lateral shearing interferometry for aspherical surface based on an orthogonal shear displacer

Zhu

Tian²,

Wang³

et al. 2022

Eng. Res. Express

View full text Add to dashboard Cite

A novel simultaneous two-step phase-shifting lateral shearing interferometry for aspherical surface based on an orthogonal shear displacer (OSD) is proposed, it is an effective technological measure of aspherical surface measurement, to effectively solve the non-uniformity of light intensity and limited transmission order caused by the beam displacer device. The OSD system is formed by the adoption of two-crystal polarization parallel beam displacers (PBDs), which makes it achieve the orthogonal shearing in the x- and y-directions simultaneously. A quarter-wave plate (QWP) is used to generate the desired phase-shifting, and four beam lateral shearing interference waves are simply generated in OSD orthogonal directions without any bulky and complicated optical components. The phase maps of the aspherical surface can be instantly obtained using the spatial phase-shifting technique with a polarization pixelated mask (or called Micro-Polarization Array: MPA) integrated into CCD. In this study, the proposed method was theoretically described and simulation results were analyzed. The simultaneous two-step phase-shifting lateral shearing interference fringes can be extracted in real-time with the MPA. The experiment results compared with the ZYGO interferometer were performed, and proved that the measurement error is not more than 2%. This interferometry has made it possible to improve the stability and feasibility of aspherical surface testing experiments.

show abstract

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Simultaneous two-step phase-shifting lateral shearing interferometry for aspherical surface based on an orthogonal shear displacer

Zhu

Tian²,

Wang³

et al. 2022

Eng. Res. Express

View full text Add to dashboard Cite

show abstract

Measurement error estimation and calibration for on-line detection phase variations in the laser-induced damage growth features of optical components

Zhou

et al. 2020

Appl. Opt.

View full text Add to dashboard Cite

The amplitude and phase distributions of reflection or transmission light are locally disturbed by damage regions. The damage state of optical components under successive laser irradiation can be evaluated according to the phase variation of a transmitted beam. The measurement accuracy of phase information related to the phase-unwrapping method is a critical factor for evaluating the damage state. This study analyzes and compares the performance of two important phase-unwrapping methods for detecting on-line large damage sites based on optimal modified lateral shearing interferometry. Meanwhile, the system stability and the measurement repeatability are also validated according to the retrieved phase pattern, which is beneficial to estimating the measurement accuracy. Experimental results of optical films are also presented and discussed to verify the feasibility of the estimation method utilized and the recommended phase-unwrapping method for on-line detection of the laser-induced damage growth features.

show abstract

On-line detection method based on optimal modified lateral shearing interferometry for evaluating the damage growth characteristics

Cited by 2 publications

References 32 publications

Simultaneous two-step phase-shifting lateral shearing interferometry for aspherical surface based on an orthogonal shear displacer

Simultaneous two-step phase-shifting lateral shearing interferometry for aspherical surface based on an orthogonal shear displacer

Measurement error estimation and calibration for on-line detection phase variations in the laser-induced damage growth features of optical components

Contact Info

Product

Resources

About