On hardware aging for practical RIS‐assisted communication systems

Abstract

In this letter, reconfigurable intelligent surface (RIS) is studied from an electronic device reliability perspective. Runtimes and lifetimes of the RIS are introduced for the first time as impairment factors that degrade the system performance. In particular, Weibull distributions are used to model the runtime‐related hardware aging (HA) effect on the RIS at first. Then, a practical RIS‐assisted system model with phase‐dependent amplitude variations, residual hardware impairments, and HA effects, is obtained. Besides, closed‐form expressions of the received signal power and spectral efficiency for the proposed system are also derived. Analytical and numerical evaluations reveal that the HA effect on the RIS is the major impairment factor when the runtime is beyond the lifetime of the RIS.

ND3$\text{D}^{3}$ QNet: Noisy dueling‐double‐deep q‐network for reconfigurable intelligent surfaces

“…Introduction: With the advent of diverse electronic devices and associated services, the increasing need for faster data speeds has prompted the requirement for innovative system architectures that excel in energy efficiency and spectral utilization [1]. Recently, the concept of reconfigurable intelligent surface (RIS), also known as intelligent reflecting surface (IRS), has emerged as a noteworthy proposal, garnering significant attention for its potential to extend coverage at low cost [2][3][4][5]. The RIS comprises a series of passive reflecting components that collaborate to intelligently redirect received signals along desired paths, achieved through software-controlled adjustments of phase shifts.…”