2021
DOI: 10.1109/jsen.2020.3019632
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On Fault Diagnosis for High-G Accelerometers via Data-Driven Models

Abstract: Shock test is a pivotal stage for designing and manufacturing space instruments. As the essential components in shock test systems to measure shock signals accurately, high-g accelerometers are usually exposed to hazardous shock environment and could be subjected to various damages. Owing to that these damages to the accelerometers could result in erroneous measurements which would further lead to shock test failures, accurately diagnosing the fault type of each high-g accelerometer can be vital to ensure the … Show more

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Cited by 17 publications
(10 citation statements)
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“…Subsequently, charges will be generated on the upper and lower surfaces of the piezoelectric element. Lastly, the acceleration of the testing object can be measured from the charges after amplification [27].…”
Section: Hardware Components 21 High-g Accelerometersmentioning
confidence: 99%
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“…Subsequently, charges will be generated on the upper and lower surfaces of the piezoelectric element. Lastly, the acceleration of the testing object can be measured from the charges after amplification [27].…”
Section: Hardware Components 21 High-g Accelerometersmentioning
confidence: 99%
“…Sensibly, the complexity of the kNN model is mainly dominated by the hyper-parameter k. Smaller k value corresponds to more complex model as the prediction from kNN could be more easily influenced by movements in the feature space. kNN is simple to be implemented, but our previous work [27] shows that standalone kNN classifier cannot achieve the best classification accuracy for faulty high-g accelerometers. A feasible strategy for improving the classification accuracy is integrating multiple individual kNN classifiers with ensemble learning [27,46].…”
Section: Software Components 31 Ensemble Knnsmentioning
confidence: 99%
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“…Abnormal data are considered the most effective indicators of sensor failure, which are nonlinear and enormous and make the data-driven intelligent diagnosis method more suitable for the diagnosis of sensor fault [11][12][13]. Machine learning algorithm is a commonly used method for intelligent diagnosis, including Neural Networks (NNs), Support Vector Machines (SVMs), and so on.…”
Section: Introductionmentioning
confidence: 99%