2014 IEEE 23rd Asian Test Symposium 2014
DOI: 10.1109/ats.2014.27
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On Covering Structural Defects in NoCs by Functional Tests

Abstract: Structural tests provide high defect coverage by considering the low-level circuit details. Functional test provides a faster test with reduced test patterns and does not imply additional hardware overhead. However, it lacks a quantitative measure of structural fault coverage. This paper fills this gap by presenting a satisfiability based method to generate functional test patterns while considering structural faults. The method targets NoC switches and links, and it is independent of the switch structure and … Show more

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Cited by 6 publications
(1 citation statement)
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References 18 publications
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“…The human designer may not be able to consider all possible temporal interactions between the complex logic circuitry and inputs of a circuit design, especially early in the design stage, and cannot guarantee full concordance of a design with user specifications. Functional and formal design verification are iterative processes that help the designer build confidence in the design [1,2]. These processes include debugging to find logic errors and behaviours that utilize deep neural networks via deep learning as a new methodology to design digital circu its.…”
Section: Introductionmentioning
confidence: 99%
“…The human designer may not be able to consider all possible temporal interactions between the complex logic circuitry and inputs of a circuit design, especially early in the design stage, and cannot guarantee full concordance of a design with user specifications. Functional and formal design verification are iterative processes that help the designer build confidence in the design [1,2]. These processes include debugging to find logic errors and behaviours that utilize deep neural networks via deep learning as a new methodology to design digital circu its.…”
Section: Introductionmentioning
confidence: 99%